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PRODUCTS
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Introduction to APT
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MARKETS / APPLICATIONS
Geosciences
Quantitative analysis of pyroxene (EPMA)
Study of melt inclusions from tephra (EPMA)
Rare Earth Element analyses (SIMS)
Stable isotopes: Carbon (LG-SIMS)
Stable isotopes: Magnesium (LG SIMS)
Geochronology - Confirming the existence of an Ancient ‘lost continent’ (LG-SIMS)
U-Pb geochronology in zircon (LG-SIMS)
Monazite geochronology (EPMA)
Vulcanology: cooling and cold storage in magma (NanoSIMS)
Biogeochemistry: analysis of extracellular biomineralization (NanoSIMS)
Environmental Science
Nuclear safeguards: U isotope analysis (LG-SIMS)
Environmental Microbiology: ecophysiology of anaerobic phototrophic bacteria (NanoSIMS)
Microbial oceanography: quantifying the contribution of microorganisms to C and N cycles (NanoSIMS)
Mining
Invisible Gold in Pyrite (NanoSIMS)
Gold clusters in Arsenopyrite (APT)
Metals
Interdiffusion in Ni-based superalloys (EPMA)
High spatial resolution mapping of precipitates in novel alloys (EPMA)
Detecting trapped hydrogen in aluminum alloy (SIMS)
Oxygen depth profiling in Zn coated steel (SIMS)
Oxidation behavior in zirconium alloys (NanoSIMS)
Grain boundary analysis in metals (APT)
Advanced materials
Small area analysis in Sn-Cu wire structures (SIMS)
Segregation and diffusion in polycrystalline materials (NanoSIMS)
Growth of noble metal nanostructures (NanoSIMS)
Interface analysis in magnetostrictive materials (APT)
Investigation of phase change separation processes (APT)
Energy materials
Dopant monitoring in LED devices (SIMS)
Purity control in PV Si feedstock (SIMS)
Materials for Energy & Catalysis (SIMS)
CIGS thin film solar cells (SIMS)
Nuclear
U and Zr interdiffusion between nuclear fuel and cladding (EPMA)
Helium migration in nuclear reactors (SIMS)
Nuclear glass alteration mechanisms (SIMS)
Semiconductor
Deep and shallow implant depth profiling (SIMS)
Impurity control (SIMS)
Ultra shallow implant metrology (EXLIE SIMS)
Atomic scale characterization of dopants (APT)
Life science
Radiation protection: Uranium diffusion through skin (SIMS)
Cell biology: protein turnover (NanoSIMS)
Cell biology: stem cell division quantification (NanoSIMS)
Biominerals: analysis of impurities in tooth (APT)
ECR Source Applications
Ion beam sputter deposition
Ion implantation
Ion beam figuring (IBF)
Etching, cleaning, polishing & milling
Ion assisted deposition
Nuclear and atomic physics
SERVICE / SUPPORT
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Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive, SXFive-TACTIS)
Upgrade Kits for APT (LEAP, EIKOS)
Upgrade Kits for ECR Sources
Software
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