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The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry

Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS™, the Atom Probe microscope for rapid alloy development and nanoscale materials research.
  • Product overview +

    The EIKOS Atom Probe offers:

    • Three-dimensional tomography with nanoscale characterization of microstructures
    • High spatial resolution single atom detection with high efficiency
    • Equal sensitivity to all elements and their isotopes
    • Quantitative composition measurement (sub-nm to near micron scale)
    • Available in voltage or voltage & laser configurations
    • Standard specimen preparation methods

    EIKOS is available in 2 configurations:

    The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.

    The fully configured EIKOS-UV system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated 355 nm laser pulsing module with computer controlled focused spot design to provide access to a larger application range.

    The base EIKOS system is field upgradable to the EIKOS-UV.

  • See what the EIKOS Atom Probe can do +

  • Download documentation +

  • View Recent Webinars +

    • Introduction to applications & technology of EIKOS-UV

      Tuesday, February 25, 2020

      Optimized or efficiency and simplicity, EIKOS-UV™ delivers all the benefits of Atom Probe Tomography and addresses a wide range of applications: metals, coatings, thin films, ceramics, minerals, functional materials in both academic and commercial environments. Robert Ulfig (CAMECA) presents the main features and functionalities of CAMECA's latest atom probe tomography instrument.
      Register here to view at any time.
      Duration: 23 minutes
      Click here to view
    • An Introduction to IVAS LT

      Monday, June 4, 2018

      If you have atom probe data, and are looking for an efficient and free method to conduct analyses, check out IVAS LT. This free version of IVAS software allows you to conduct a number of different tests on your data. Learn more by watching this free, short webinar, and then download your copy of IVAS LT!
      Duration : 19 minutes
      Click here to view
    • Atom Probe Tomography for Additive Manufacturing Part 1

      Friday, April 19, 2019

      Intro to AM Methods and Maraging Steel Case Study Deals with maraging steel. Click the link to watch this short webinar with a Q&A session.
      Duration : 23 minutes
      Click here to view
  • Video +

  • APT users around the world +

  • Software +

    • AP Suite 6
      AP Suite 6

      The Atom Prober's Toolkit for Data Analysis Workstations: a user-friendly, collaborative platform to seamlessly manage your entire Atom Probe Tomography research projects within one single environment.

      Keep Reading

    • IVAS Software

      Specifically developed for the CAMECA Atom Probes, IVAS provides powerful visualization and analysis features to extract 1D, 2D and 3D quantitative information collected on APT instruments, quickly and easily.

      Keep Reading

  • Upgrade kits +

    Options for LEAP®

    Integrated Plasma Cleaner
    A fully-integrated, automated plasma cleaner offers both increased productivity and reduced cost of ownership for the LEAP system.

    Residual Gas Analyzer
    Allows partial pressure analysis of LEAP instrument. 

    LEAP 5000 VCTM
    The Vacuum and Cryo Transfer Module (VCTM) enables specimens to be transported between LEAP and ancillary workstations while maintaining both UHV and cryogenic conditions. The module utilizes a UHV-compatible portable chamber which is fully integrated (via a docking station) into the LEAP 5000. Note that the additional workstations must also be compatible with the VCTM and this is not included with this option. Please contact CAMECA sales for more details.

    Productivity Enhancement Package
    Extends the storage capacity of the LEAP system and includes a fully-integrated in situ heated carousel to reduce pump down times, increase specimen throughput and improve vacuum quality.

    Anti-vibration Package
    Active vibration isolation platform allowing the LEAP to be installed in environments not meeting vibration standards, this integrated solution combines active vibration cancellation together with an upgraded LEAP platform. Patented piezoelectric Technology cancels floor vibration in real time with active bandwidth starting at 0.6Hz.

    Seismic Kit
    Factory-fitted seismic restraint kit. Floor requirements must be met for purchase of this option.

    Field-Ion-Microscope (eFIM) Module
    Adds Field-Ion-Microscope (FIM) capability to LEAP system

    Options for LEAP® and EIKOS™

    Manual Electropolisher

    The manual electropolishing unit is designed to allow maximum flexibility for production of specimens from a wide variety of materials. The item includes power supply, chemical handling and all accessories required to prepare high quality atom probe specimens. (Optical microscope and Chemical reagents are not included.)

    Adv sample prep kit
    Advanced specimen preparation kit includes key components required for advanced FIB-based specimen preparation.

  • Technical notes +