Your browser is out of date. The site is optimized for IE 9 (not compatibility mode) and above, Chrome 29, Firefox 23 and Safari 6.0.
Skip to content
International
This site in other countries/regions:
Select Country to see regional site for cameca.com
Brazilian Portuguese
Korean
Chinese
Spanish
International
Toggle navigation
PRODUCTS
SIMS
Introduction to SIMS
IMS 7f-Auto
IMS 7f-GEO
IMS 1300-HR³ - Large Geometry SIMS
KLEORA
NanoSIMS-HR
NanoSIMS 50L
AKONIS
IMS Wf & SC Ultra
SIMS 4550
ACTINIS - Shielded Ion Microprobe
APT
Introduction to APT
Invizo 6000
LEAP 6000 XR
LEAP 5000
EIKOS-UV
ECR Sources
CAMECA ECR Technology (formerly Polygon Physics)
TES-GO
TES-40
TES-63
TES-100
HEXAR
Faraday Cup
Choose your source
MARKETS / APPLICATIONS
Geosciences
Quantitative analysis of pyroxene (EPMA)
Study of melt inclusions from tephra (EPMA)
Rare Earth Element analyses (SIMS)
Stable isotopes: Carbon (LG-SIMS)
Stable isotopes: Magnesium (LG SIMS)
Geochronology - Confirming the existence of an Ancient ‘lost continent’ (LG-SIMS)
U-Pb geochronology in zircon (LG-SIMS)
Monazite geochronology (EPMA)
Vulcanology: cooling and cold storage in magma (NanoSIMS)
Biogeochemistry: analysis of extracellular biomineralization (NanoSIMS)
Environmental Science
Nuclear safeguards: U isotope analysis (LG-SIMS)
Environmental Microbiology: ecophysiology of anaerobic phototrophic bacteria (NanoSIMS)
Microbial oceanography: quantifying the contribution of microorganisms to C and N cycles (NanoSIMS)
Mining
Invisible Gold in Pyrite (NanoSIMS)
Gold clusters in Arsenopyrite (APT)
Metals
Interdiffusion in Ni-based superalloys (EPMA)
High spatial resolution mapping of precipitates in novel alloys (EPMA)
Detecting trapped hydrogen in aluminum alloy (SIMS)
Oxygen depth profiling in Zn coated steel (SIMS)
Oxidation behavior in zirconium alloys (NanoSIMS)
Grain boundary analysis in metals (APT)
Advanced materials
Small area analysis in Sn-Cu wire structures (SIMS)
Segregation and diffusion in polycrystalline materials (NanoSIMS)
Growth of noble metal nanostructures (NanoSIMS)
Interface analysis in magnetostrictive materials (APT)
Investigation of phase change separation processes (APT)
Energy materials
Dopant monitoring in LED devices (SIMS)
Purity control in PV Si feedstock (SIMS)
Materials for Energy & Catalysis (SIMS)
CIGS thin film solar cells (SIMS)
Nuclear
U and Zr interdiffusion between nuclear fuel and cladding (EPMA)
Helium migration in nuclear reactors (SIMS)
Nuclear glass alteration mechanisms (SIMS)
Semiconductor
Deep and shallow implant depth profiling (SIMS)
Impurity control (SIMS)
Ultra shallow implant metrology (EXLIE SIMS)
Atomic scale characterization of dopants (APT)
Life science
Radiation protection: Uranium diffusion through skin (SIMS)
Cell biology: protein turnover (NanoSIMS)
Cell biology: stem cell division quantification (NanoSIMS)
Biominerals: analysis of impurities in tooth (APT)
ECR Source Applications
Ion beam sputter deposition
Ion implantation
Ion beam figuring (IBF)
Etching, cleaning, polishing & milling
Ion assisted deposition
Nuclear and atomic physics
SERVICE / SUPPORT
AMECARE
Service Solutions
Training
Upgrades and Accessories
Upgrade kits for IMS 6f and 7f
Upgrade Kits for IMS 1270 / 1280 / 1280-HR
Upgrade kits for NanoSIMS 50 and 50L
Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive, SXFive-TACTIS)
Upgrade Kits for APT (LEAP, EIKOS)
Upgrade Kits for ECR Sources
Software
WinCurve
SmartPRO
WinImage II
APM
PeakSight
AP Suite 6
IVAS
CAMECA Software Updates
Relocation Services
Service Visit Evaluation
Get Technical & Application Support
LEARNING ZONE
Applications & product literature
SIMS & NanoSIMS
APT
EPMA
ECR Sources
Blog
Scientific Publications
SIMS & NanoSIMS
APT
EPMA
ECR Sources
Tutorials
Webinars
EPMA
SIMS & NanoSIMS
APT
COMPANY / NEWS
About us
Company Overview
Mission Statement
CAMECA is a business unit of AMETEK, Inc.
News and Events
What's New
Conferences and Trade Shows
Careers
Links
IMS xf Series
Large Geometry SIMS
NanoSIMS
IMS Wf / SC Ultra
EPMA - SX Product Line
Atom Probe
CONTACT
Your way to CAMECA
CAMECA Headquarters
CAMECA Atom Probe Technology Center
CAMECA Source Technology Center
International distributors
Contact Us
Sign up for the newsletter
Applications & product literature
SIMS & NanoSIMS
APT
EPMA
ECR Sources
ECR Sources
TES-GO
+
TES-GO Product – Flyer
TES-40
+
TES-40 Product – Flyer
TES-63
+
TES-63 Product – Flyer
TES-100
+
TES-100 Product – Flyer
HEXAR
+
HEXAR Product – Flyer
MacCMS
×