Our Secondary Ion Mass Spectrometers are a world reference, combining unequaled sensitivity and detection limits (even on light elements) with high productivity.
Exclusively developed by CAMECA, Atom Probe Tomography instruments offer extensive capabilities for nanoscale 3D imaging and compositional measurements.
Our Electron Probe Microanalyzers equipped with industry-leading WDS spectrometers are renowned for their superior x-ray mapping and quantitative analysis capabilities.
By continuing to use the site you agree to our privacy and cookie policy