PRODUCTS

  • SIMS
    SIMS

    Our Secondary Ion Mass Spectrometers are a world reference, combining unequaled sensitivity and detection limits (even on light elements) with high productivity.

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  • APT
    APT

    Exclusively developed by CAMECA, Atom Probe Tomography instruments offer extensive capabilities for nanoscale 3D imaging and compositional measurements.

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  • EPMA
    EPMA

    Our Electron Probe Microanalyzers equipped with industry-leading WDS spectrometers are renowned for their superior x-ray mapping and quantitative analysis capabilities.

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  • LEXES
    LEXES

    Used by top semiconductor companies, our compositional metrology tools support innovation at 14nm node and beyond, ensuring new process integration and high volume production

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