APT

Atom Probe Tomography (APT) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, APT has contributed to major advances in materials science.

Introduction to APT

Basic principles for APT sample preparation, data collection, visualization and analysis.
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LEAP 5000 : 3D Atom Probe Microscope

The Atom Probe with 3D unmatched subnanometer analytical performance in metals, oxides, ceramics, semiconductors, bio-minerals and geochemistry.
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EIKOS-UV

The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry.
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PRODUCTS

APT

Introduction to APT

LEAP 5000 : 3D Atom Probe Microscope

EIKOS-UV