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Atom Probe Tomography (APT) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, APT has contributed to major advances in materials science.
  • Atom Probe Tomography
    Introduction to APT

    Basic principles for APT sample preparation, data collection, visualization and analysis.

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  • LEAP 5000
    LEAP 5000

    The Atom Probe with 3D unmatched subnanometer analytical performance in metals, oxides, ceramics, semiconductors, bio-minerals and geochemistry.

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    The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry.

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