Skip to content

APT

Atom Probe Tomography (APT) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, APT has contributed to major advances in materials science.
  • Atom Probe Tomography
    Introduction to APT

    Basic principles for APT sample preparation, data collection, visualization and analysis.

    Keep Reading
  • LEAP 5000
    LEAP 5000

    The Atom Probe with 3D unmatched subnanometer analytical performance in metals, oxides, ceramics, semiconductors, bio-minerals and geochemistry.

    Keep Reading
  • EIKOS
    EIKOS-UV

    The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry.

    Keep Reading