Discover Our Latest Blog Posts!
Explore our two newest blog articles covering key innovations in materials analysis and Atom Probe workflows.
Learn how Dynamic SIMS is pushing the limits of hydrogen detection and high-resolution imaging, enabling advanced characterization of semiconductors and challenging materials.
Dive also into the latest AP Suite 6.3.3 update, featuring improved workflows, smarter tools, and enhanced data analysis capabilities for Atom Probe Tomography.
👉 Discover the full articles on our blog.
Unveiling Hydrogen: How Dynamic SIMS Pushes the Limits of Sensitivity in Today’s Most Challenging Materials
Authors: Paula PERES, Jinlei REN, Seoyoun CHOI
How Dynamic SIMS, and in particular the IMS 7f-Auto, delivers ultra‑low hydrogen detection, fast depth profiling, and high‑resolution imaging for semiconductors and advanced materials.
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What’s New in
AP Suite 6.3.3:
Smoother Workflows, Smarter Tools,
and More Powerful Analysis
Author: Lazar Vucicevic, Katherine Rice
AP Suite 6.3.3 delivers a major upgrade to APT data acquisition and analysis, introducing smarter ROI tools, enhanced isosurface analysis, deeper automation, and smoother workflows for both researchers and engineers.
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