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Free tutorial guides to EPMA, SIMS & APT

Co-edited with Wiley, Essential Knowledge Briefs on Electron Probe Microanalysis, Secondary Ion Mass Spectrometry and Atom Probe Tomography provides a simple introduction to each analytical technique, details some of its specific implementations and explores the developments that are likely to be seen in the future. Case studies provide examples of how each technique is used in the real world by leaders in fields spanning materials science, geochemistry, life sciences and more!

Each short guide is available in pdf as well mobile-enabled formats. Click on the links below to download your preferred version.

Electron Probe Microanalysis: Dynamic SIMS: Atom Probe Tomography: