Co-edited with Wiley, our Essential Knowledge Briefs on Electron Probe Microanalysis, Secondary Ion Mass Spectrometry and Atom Probe Tomography provide a simple introduction to each analytical technique, detail implementations and explore the developments that are likely to be seen in the future. Case studies provide examples of how each technique is used in the real world by leaders in fields spanning materials science, geochemistry, life sciences and more!
Each short guide is available in pdf as well mobile-enabled formats. Click on the links below to download your preferred version.
Electron Probe Microanalysis:
Dynamic SIMS:
Atom Probe Tomography: