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PRODUCTS
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Introduction to SIMS
IMS 7f-Auto
IMS 7f-GEO
IMS 1300-HR³
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Shielded IMS
APT
Introduction to APT
LEAP 5000
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Introduction to EPMA
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SXFiveFE
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SKAPHIA
LEXES
Introduction to LEXES
EX-300 Shallow Probe
MARKETS
Geosciences
Quantitative analysis of pyroxene (EPMA)
Rare Earth Element analyses (SIMS)
Stable isotopes: Carbon (LG-SIMS)
Stable isotopes: Magnesium (LG SIMS)
Geochronology - Confirming the existence of an Ancient ‘lost continent’ (LG-SIMS)
U-Pb geochronology in zircon (LG-SIMS)
Monazite geochronology (EPMA)
Vulcanology: cooling and cold storage in magma (NanoSIMS)
Biogeochemistry: analysis of extracellular biomineralization (NanoSIMS)
Environmental Science
Nuclear safeguards: U isotope analysis (LG-SIMS)
Environmental Microbiology: ecophysiology of anaerobic phototrophic bacteria (NanoSIMS)
Microbial oceanography: quantifying the contribution of microorganisms to C and N cycles (NanoSIMS)
Mining
Invisible Gold in Pyrite (NanoSIMS)
Gold clusters in Arsenopyrite (APT)
Metals
Interdiffusion in Ni-based superalloys (EPMA)
Detecting trapped hydrogen in aluminum alloy (SIMS)
Oxygen depth profiling in Zn coated steel (SIMS)
Oxidation behavior in zirconium alloys (NanoSIMS)
Grain boundary analysis in metals (APT)
Advanced materials
Small area analysis in Sn-Cu wire structures (SIMS)
Segregation and diffusion in polycrystalline materials (NanoSIMS)
Growth of noble metal nanostructures (NanoSIMS)
Interface analysis in magnetostrictive materials (APT)
Investigation of phase change separation processes (APT)
Energy materials
Dopant monitoring in LED devices (SIMS)
Purity control in PV Si feedstock (SIMS)
Materials for Energy & Catalysis (SIMS)
CIGS thin film solar cells (SIMS)
Nuclear
Helium migration in nuclear reactors (SIMS)
Nuclear glass alteration mechanisms (SIMS)
Semiconductor
Deep and shallow implant depth profiling (SIMS)
Impurity control (SIMS)
Ultra shallow implant metrology (EXLIE SIMS)
Atomic scale characterization of dopants (APT)
3D FinFET metrology (LEXES)
Life science
Radiation protection: Uranium diffusion through skin (SIMS)
Cell biology: protein turnover (NanoSIMS)
Cell biology: stem cell division quantification (NanoSIMS)
Biominerals: analysis of impurities in tooth (APT)
SERVICE / SUPPORT
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Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive)
Upgrade Kits for APT (LEAP, EIKOS)
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CONTACT
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CONTACT
Your way to CAMECA
CAMECA Headquarters
CAMECA Atom Probe Technology Center
International distributors
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