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PRODUCTS
SIMS
Introduction to SIMS
IMS 7f-Auto
IMS 7f-GEO
IMS 1300-HR³ - Large Geometry SIMS
KLEORA
NanoSIMS 50L
AKONIS
IMS Wf & SC Ultra
SIMS 4550
ACTINIS - Shielded Ion Microprobe
APT
Introduction to APT
LEAP 5000
EIKOS-UV
EPMA
Introduction to EPMA
SXFive
SXFiveFE
SXFive-TACTIS
SKAPHIA
LEXES
Introduction to LEXES
EX-300 Shallow Probe
MARKETS
Geosciences
Quantitative analysis of pyroxene (EPMA)
Study of melt inclusions from tephra (EPMA)
Rare Earth Element analyses (SIMS)
Stable isotopes: Carbon (LG-SIMS)
Stable isotopes: Magnesium (LG SIMS)
Geochronology - Confirming the existence of an Ancient ‘lost continent’ (LG-SIMS)
U-Pb geochronology in zircon (LG-SIMS)
Monazite geochronology (EPMA)
Vulcanology: cooling and cold storage in magma (NanoSIMS)
Biogeochemistry: analysis of extracellular biomineralization (NanoSIMS)
Environmental Science
Nuclear safeguards: U isotope analysis (LG-SIMS)
Environmental Microbiology: ecophysiology of anaerobic phototrophic bacteria (NanoSIMS)
Microbial oceanography: quantifying the contribution of microorganisms to C and N cycles (NanoSIMS)
Mining
Invisible Gold in Pyrite (NanoSIMS)
Gold clusters in Arsenopyrite (APT)
Metals
Interdiffusion in Ni-based superalloys (EPMA)
Detecting trapped hydrogen in aluminum alloy (SIMS)
Oxygen depth profiling in Zn coated steel (SIMS)
Oxidation behavior in zirconium alloys (NanoSIMS)
Grain boundary analysis in metals (APT)
Advanced materials
Small area analysis in Sn-Cu wire structures (SIMS)
Segregation and diffusion in polycrystalline materials (NanoSIMS)
Growth of noble metal nanostructures (NanoSIMS)
Interface analysis in magnetostrictive materials (APT)
Investigation of phase change separation processes (APT)
Energy materials
Dopant monitoring in LED devices (SIMS)
Purity control in PV Si feedstock (SIMS)
Materials for Energy & Catalysis (SIMS)
CIGS thin film solar cells (SIMS)
Nuclear
Helium migration in nuclear reactors (SIMS)
Nuclear glass alteration mechanisms (SIMS)
Semiconductor
Deep and shallow implant depth profiling (SIMS)
Impurity control (SIMS)
Ultra shallow implant metrology (EXLIE SIMS)
Atomic scale characterization of dopants (APT)
3D FinFET metrology (LEXES)
Life science
Radiation protection: Uranium diffusion through skin (SIMS)
Cell biology: protein turnover (NanoSIMS)
Cell biology: stem cell division quantification (NanoSIMS)
Biominerals: analysis of impurities in tooth (APT)
SERVICE / SUPPORT
Service Solutions
Training
Upgrades and Accessories
Upgrade kits for IMS 6f and 7f
Upgrade Kits for IMS 1270 / 1280 / 1280-HR
Upgrade kits for NanoSIMS 50 and 50L
Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive)
Upgrade Kits for APT (LEAP, EIKOS)
Relocation Services
Software
WinCurve
WinImage II
APM
PeakSight
AP Suite 6
IVAS
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AMECARE
LEARNING ZONE
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SIMS & NanoSIMS
APT
EPMA
LEXES
COMPANY / NEWS
About us
Company Overview
Mission Statement
AMETEK Materials Analysis Division
News and Events
What's New
Conferences and Trade Shows
2020 Calendar Image Gallery
Thin layer analysis
Irradiation-induced segregation at grain boundaries
Coral symbiosis study
Clinopyroxene zoning analysis
Biological impact of metallic nanoparticles
Oxidation resistance study of alloys
Isotope mapping of inclusions in meteorite
Magmatic studies
Development of elemental biosignatures
Dental studies: tooth enamel composition
S-isotope composition of nanopyrite
Metamorphic petrology
Early solar system evolution
2019 Calendar Image Gallery
NanoSIMS 3D imaging of dopamine in neuronal cells
EPMA of Mukundpura meteorite
APT imaging of precipitates in Ni-based alloy
Symbiotic bacteria in plant root
Mapping for trace elements in Cassiterite
APT of L12 nanoprecipitates in an aluminum superalloy
SIMS 3D image reconstruction of III-V solar cells
EPMA of fluid-rock interactions
Failure analysis of quantum cascade lasers with Dynamic SIMS
APT analysis of deformation mechanisms in pyrite grains
Warhol-inspired mosaic of a 15N-enriched cyanobacterial consortia acquired with NanoSIMS 50L
Investigation of growth zoning in volcanic rocks with EPMA
Links
IMS xf Series
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NanoSIMS
IMS Wf / SC Ultra
EPMA - SX Product Line
Atom Probe
CONTACT
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CAMECA Headquarters
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International distributors
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CONTACT
Your way to CAMECA
CAMECA Headquarters
CAMECA Atom Probe Technology Center
International distributors
Contact Us
Sign up for the newsletter
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