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Introduction to SIMS
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APT
Introduction to APT
LEAP 5000
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Introduction to EPMA
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SXFiveFE
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SKAPHIA
LEXES
Introduction to LEXES
EX-300 Shallow Probe
ICP-MS
Introduction to ICP-MS
Sapphire
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Attom ES
Plasma 1700
GD-MS
Introduction to GD-MS
Astrum
SIRMS
Introduction to SIRMS
Perspective
Horizon
Panorama
TIMS
Introduction to TIMS
TIMS
Noble Gas
Introduction to Noble Gas
Noblesse HR
MARKETS
Geosciences
Quantitative analysis of pyroxene (EPMA)
Rare Earth Element analyses (SIMS)
Stable isotopes: Carbon (LG-SIMS)
Stable isotopes: Magnesium (LG SIMS)
U-Pb geochronology in zircon (LG-SIMS)
Monazite geochronology (EPMA)
Vulcanology: cooling and cold storage in magma (NanoSIMS)
Biogeochemistry: analysis of extracellular biomineralization (NanoSIMS)
Radium isotopes in seawater (MC-ICP-MS)
Laser ablation split stream petrochronology (MC-ICP-MS)
Boron isotopes in carbonatites (MC-ICP-MS)
In-situ sulfur isotopic measurements of sulphide samples (MC-ICP-MS)
Biological carbon fixation and iron isotopes in Pacific Ocean (MC-ICP-MS)
Environmental Science
Nuclear safeguards: U isotope analysis (LG-SIMS)
Environmental Microbiology: ecophysiology of anaerobic phototrophic bacteria (NanoSIMS)
Microbial oceanography: quantifying the contribution of microorganisms to C and N cycles (NanoSIMS)
Mercury isotopes used for contamination source identification (MC-ICP-MS)
Mining
Invisible Gold in Pyrite (NanoSIMS)
Gold clusters in Arsenopyrite (APT)
Metals
Interdiffusion in Ni-based superalloys (EPMA)
Oxygen depth profiling in Zn coated steel (SIMS)
Oxidation behavior in zirconium alloys (NanoSIMS)
Grain boundary analysis in metals (APT)
Advanced materials
Small area analysis in Sn-Cu wire structures (SIMS)
Segregation and diffusion in polycrystalline materials (NanoSIMS)
Growth of noble metal nanostructures (NanoSIMS)
Interface analysis in magnetostrictive materials (APT)
Investigation of phase change separation processes (APT)
Energy materials
Dopant monitoring in LED devices (SIMS)
Purity control in PV Si feedstock (SIMS)
Nuclear
Helium migration in nuclear reactors (SIMS)
Nuclear glass alteration mechanisms (SIMS)
Spatially resolved measurements of plutonium isotopes in environmental particle samples (MC-ICP-MS)
Semiconductor
Deep and shallow implant depth profiling (SIMS)
Impurity control (SIMS)
Ultra shallow implant metrology (EXLIE SIMS)
Atomic scale characterization of dopants (APT)
3D FinFET metrology (LEXES)
Life science
Cell biology: protein turnover (NanoSIMS)
Cell biology: stem cell division quantification (NanoSIMS)
Biominerals: analysis of impurities in tooth (APT)
Isotopic evidence of unaccounted for iron and copper erythropoietic pathways (MC-ICP-MS)
SERVICE / SUPPORT
Service Solutions
Training
Upgrades and Accessories
Upgrade kits for IMS 6f and 7f
Upgrade Kits for IMS 1270 / 1280 / 1280-HR
Upgrade kits for NanoSIMS 50 and 50L
Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive)
Upgrade Kits for APT (LEAP, EIKOS)
Upgrade kits for Plasma ICP-MS
Upgrade kits for Attom ICP-MS
Upgrade kits for Astrum GD-MS
Relocation Services
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WinImage II
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CONTACT
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