This application note, conducted using the LEAP® 6000 XR atom probe, reveals a previously unrecognized mechanism governing laser‑assisted field evaporation in insulating materials such as chromia (Cr₂O₃) and SrTiO₃. Contrary to the long‑standing assumption that evaporation in oxides is triggered solely by thermal pulses, the research demonstrates that deep‑UV laser illumination can generate charge‑carrier holes through photoionization and photo‑induced electron tunneling.
This breakthrough provides:
- Higher evaporation yield at lower fields for fragile oxide specimens
- Improved understanding of APT behavior in wide‑bandgap materials
- A mechanism that explains previously puzzling results on materials such as MgO, Fe₃O₄, and GaN
- Insight into how next‑generation laser systems in LEAP instruments enable advanced analytical capabilities
These findings mark a major step toward refining our physical understanding of
atom probe mechanisms in insulating materials and open new possibilities for nanoscale characterization across a wider range of complex oxides.
📄 Read the full Application Note:
Unlocking New Mechanisms In Laser-Assisted Field Evaporation of Oxides
To further explore this discovery and its implications for nanoscale characterization, a dedicated webinar is also available, offering a deeper dive into the experimental approach and key findings.
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