Discover how Dynamic SIMS enables ultra-sensitive elemental and isotopic analysis, from trace detection and high-resolution depth profiling to advanced imaging and isotope measurements.
This tutorial provides a practical introduction to Dynamic SIMS with magnetic-sector instruments, covering the fundamentals of sputtering, secondary ion generation, mass analysis, quantification, and data interpretation. Participants will learn how Dynamic SIMS delivers unique analytical capabilities, including trace element detection at ppm-to-ppb levels, nanoscale depth resolution, high-precision isotope ratio measurements, and high-resolution elemental and isotopic 2D/3D imaging.
Through real-world examples, attendees will discover how Dynamic SIMS is applied across a wide range of fields, including semiconductor process control, advanced materials research, geosciences, environmental studies, and life sciences.
▶️ "Understanding Dynamic SIMS with Magnetic-Sector Instruments: From Fundamentals to Practical Applications"
📅 November 24, 2026 - 10 AM CET or 5 PM CET (Paris)
⭐ Key learnings will include:
- Dynamic SIMS fundamentals and magnetic-sector instrumentation
- Trace element and isotope analysis capabilities
- Depth profiling, elemental and isotopic mapping, and 3D reconstruction
- Quantification, matrix effects, and charge compensation
- Practical applications across research and industry
Whether you are new to SIMS or looking to broaden your analytical expertise, this session will help you understand when and how Dynamic SIMS can provide unique insights into the elemental and isotopic characterization of materials.
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🎙️ About the speaker:
Paula Peres received her PhD in Solid State Physics from CEA Saclay and Paris University XI in 2002 and joined CAMECA as a SIMS Applications Engineer in 2003. After several years as Product Manager for the IMS xf and LG-SIMS product lines, she became Applications Manager for CAMECA SIMS in 2022. She currently leads the Applications Engineering team, with responsibility for instrument demonstrations, application development and customer support across the SIMS product portfolio. She has authored or co-authored more than 20 publications on dynamic SIMS instrumentation and applications.
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