Advanced Materials

Browse all applications for advanced materials

Elemental depth profiling, boundary mapping, particle characterization, and the analysis of precipitates, contaminants, elemental segregation and diffusion… Scientists rely on SIMS and APT to gain deeper insight into the properties of advanced materials used in transportation, energy production, aerospace, and consumer products.

Advanced Materials

Small area analysis in Sn-Cu wire structures (SIMS)

The CAMECA IMS 7f-Auto provides high (sub-micron) lateral resolution, which is of great interest for material analysis.

Advanced Materials

Segregation and diffusion in polycrystalline materials (NanoSIMS)

Combining high sensitivity with high spatial resolution, the NanoSIMS is used to study the segregation and diffusion of elements in complex materials.

Advanced Materials

Growth of noble metal nanostructures (NanoSIMS)

Plasmon-mediated growth of noble metal nanostructures: the role of PVP in directing the anisotropic growth of Au nanoprisms

Advanced Materials

Interface analysis in magnetostrictive materials (APT)

3D Atom Probe is capable of analyzing brittle materials, e.g. interfaces in multilayer structures with unique in-depth resolution and excellent thoughtput.

Advanced Materials

Investigation of phase change separation processes (APT)

Thanks to unique spatial resolution capabilities, CAMECA Atom Probes can investigate phase separation processes in energy storage materials.

At IHPP PAS (Unipress), we work on nitride semiconductors—from gallium nitride (GaN) crystals to advanced devices such as laser diodes. SIMS testing is fundamental to our research, allowing us to assess material purity and precisely control the implantation of acceptor dopants like magnesium into GaN substrates... As we continue exploring new directions in GaN-based technologies, SIMS will remain a key tool for guiding our material development and process optimization. "

Artur Lachowski

High Pressure Research Center of the Polish Academy of Sciences, Warsaw, Poland

  As a scientist interested in interfacial phenomena, the LEAP® 5000 has provided a transformative microscope in quantifying elemental behavior across of a variety of material surfaces. This has enabled new understanding of material’s chemical structure and its effect in controlling properties, wether that be electrical, magnetic, optical or mechanical. "

Prof. Gregory B. Thompson

University of Alabama, USA

Among all characterization techniques used, SIMS uniquely enabled direct verification that helium incorporation remained minimal and that implanted or incorporated helium could diffuse out during laser processing or subsequent annealing. "

Prof. Ji-Hong Zhao

Jilin University, Changchun, China

Advanced Materials

Advanced Materials

Small area analysis in Sn-Cu wire structures (SIMS)

Advanced Materials

Segregation and diffusion in polycrystalline materials (NanoSIMS)

Advanced Materials

Growth of noble metal nanostructures (NanoSIMS)

Advanced Materials

Interface analysis in magnetostrictive materials (APT)

Advanced Materials

Investigation of phase change separation processes (APT)

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