EIKOS-UV
The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry
Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS-UV™, the Atom Probe microscope for rapid alloy development and nanoscale materials research.
Product Details
The EIKOS Atom Probe offers:
Three-dimensional tomography with nanoscale characterization of microstructures
High spatial resolution single atom detection with high efficiency
Equal sensitivity to all elements and their isotopes
Quantitative composition measurement (sub-nm to near micron scale)
Available in voltage or voltage & laser configurations
Standard specimen preparation methods
EIKOS is available in 2 configurations:
EIKOS
The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.
EIKOS-UV
The fully configured EIKOS-UV system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated 355 nm laser pulsing module with computer controlled focused spot design to provide access to a larger application range.
The base EIKOS system is field upgradable to the EIKOS-UV.
Benefits
Discover the key advantages that set our solution apart. From increased efficiency to exceptional support, these benefits are designed to deliver real value and help you achieve more with confidence.
Webinars
Introduction to Applications & Technology of EIKOS-UV
Optimized or efficiency and simplicity, EIKOS-UV™ delivers all the benefits of Atom Probe Tomography and addresses a wide range of applications: metals, coatings, thin films, ceramics, minerals, functional materials in both academic and commercial environments. Robert Ulfig (CAMECA) presents the main features and functionalities of CAMECA's latest atom probe tomography instrument.
Atom Probe Tomography for Additive Manufacturing Part 1
Intro to AM Methods and Maraging Steel Case Study Deals with maraging steel.
An Introduction to IVAS LT
If you have atom probe data, and are looking for an efficient and free method to conduct analyses, check out IVAS LT. This free version of IVAS software allows you to conduct a number of different tests on your data. Learn more by watching this free, short webinar, and then download your copy of IVAS LT!
Downloads
Application Note
Flyer
EIKOS-UV™
Technical Note
APT Specimen preparation: Electropolishing
Backside FIB Lift‑Out and ARM Mounting Procedure for APT
Cross-section FIB Lift-out and ARM Mounting Procedure for APT
FIB Mounting to Wire Substrates
On the Isolation of Single Semiconductor Devices for APT
Practical Use of Capping for FIB Specimen Preparation and APT
Standard FIB Lift‑Out Sample Preparation Procedure for APT
Standard FIB Sharpening Procedure for APT
STEM for APT
Transmission EBSD of APT Specimens
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