Invizo 6000
The 3D Atom Probe with the Largest field of View
The Invizo 6000™ 3D Atom Probe microscope introduces major technology breakthroughs to push the boundaries of atom probe analysis. Its ultra wide field of view flight path and unique dual-beam deep UV laser pulse system result in higher single-specimen yield and a greater analysis volume with improved reconstruction fidelity, allowing more information to be obtained from each dataset. The Invizo 6000 is an ideal choice for advanced research on a diverse set of applications.
Product Details
At the core of CAMECA’s Invizo 6000 3D Atom Probe is a completely new counter electrode concept which, in addition to enabling ion optics with unprecedented APT field of view, allows the symmetric laser illumination of the specimen, thus leading to unrivaled analytical capabilities.
The Invizo 6000 offers a unique combination of the largest field of view of all 3D Atom Probes, while maintaining a high mass resolving power (MRP) thanks to a novel double einzel lens technology. It also incorporates an advanced 257.5 nm deep UV (DUV) laser module enabling dramatic improvements in specimen yield and data reconstruction quality.
Better control your experiment and access lower detection rates by capturing more of the evaporated surface to achieve better data quality and specimen yield
Improve your reconstruction accuracy though more uniform adsorption of the DUV laser and thermally-coincident dual sided illumination of the specimen
Capture larger volumes in less time to provide more data from your region of interest
Benefits
Discover the key advantages that set our solution apart. From increased efficiency to exceptional support, these benefits are designed to deliver real value and help you achieve more with confidence.
Webinars
Atom Probe Tomography of Porous Solid Oxide Fuel Cells
Join Lazar Vucicevic and Dr. Katherine Rice to discover how atom probe tomography reveals microstructural evolution in porous SOFC electrodes - and how new laser technology improves yield.
High Impact Research: Composition Metrology & Correlative Microscopy of Wide Bandgap Semiconductors with APT
In the last decade, atom probe tomography (APT) has emerged as a valuable tool in the study of III-N semiconductors. In optoelectronics, it has provided insights into the nanostructure of light emitting diodes (LEDs), laser diodes and microwires. In nano-electronics, it has allowed insights into doping and alloying effects in transistors...
An Introduction to Atom Probe Tomography and its Applications
CAMECA's Dr. Katherine Rice presents an Introduction to Atom Probe Tomography in a webinar hosted by the Materials Research Society. If you're looking for an easy introduction to the technique, an overview of APT instrumentation and the benefits to your institution or organization, this webinar is a great starting point. Packed with examples, it's the perfect primer on this powerful technology.
Introduction of 6000 Generation : Invizo 6000 & LEAP 6000 XR
Following the introduction of the Local Electrode Atom Probe (LEAP) in 2003, Atom Probe Tomography (APT) has become a standard material science method enabling 3D nanoscale compositional characterization of metals and alloys, ceramics, semiconductors, biomaterials and geological materials.
What to Expect When You're Expecting an Atom Probe
This webinar will discuss the typical process that happens with purchasing an atom probe microscope. We will present best practices, equipment, and personnel you will need as well as common pitfalls that can complicate the whole process.
Downloads
Application Note
01 - Carbon Segregation with LEAP and STEM
07 – LED Device Engineering
11 - 3D FinFET: Analysis of a 14 nm Device
15 - Correlative Grain Boundary Characterization
16 - Optoelectronics: Dopant Distribution in ALD‑grown ZnO
18 - Paleoclimatology: Organic Matrices in Biogenic Carbonates
20 - APT‑STEM Imaging for Enhanced 3D Reconstruction
26 -Stronger High‑Temperature Light Alloys Enabled by APT
27 - Nanogeochronology by Atom Probe Tomography
32 - Biomedical: Developing APT for Bone Tissue Repair Medical Devices
33 - Grain Boundary Analysis in Ni‑based Superalloys
34 - Hydrogen Embrittlement Studies
37 – Off‑the‑Shelf FinFET Device Characterization by APT
Interview
Making Green Steels with Hydrogen
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