Accessories and Consumables
Find Consumables Accessories and Options for APT and LEAP products
| Item | Description | Part Number(s) |
| Local Electrode Assembly (New) | Pre-cleaned, tested, UHV packed local electrode assembly with 30–60 µm aperture opening and <5 µm roundness variance. | 24603; 24047 (pack of 8) |
| Local Electrode (Refurbished) | Refurbished local electrode with new cone electrode, cleaned, tested to new specifications, and UHV packed. | 24603-R |
| LEAP Quality Assurance Test Kit | 10 aluminium specimens on presharpened microtip coupon plus one local electrode test flat for LEAP QA testing. | 21772 |
| Consumables Credit Package | Credit package redeemable against future consumable requirements up to a specified value. | 23886 |
| Presharpened Microtip™ Coupons (PSM M36) | 36-specimen grid of presharpened microtips supplied on silicon coupons. | 21611 (pack of 10); 21505 (each) |
| Microtip for FIB Liftout Mounting (FT M36 – LEAP 3000) | 36-specimen grid of flat-top microtips for FIB liftout mounting. | 21909 (pack of 10); 21753 (each) |
| Microtip Coupons for FIB Liftout (M22) | 22-specimen grid of flat-top microtips designed for FIB liftout workflows. | 23265 (pack of 10); 23264 (each) |
| Microtip Coupons for Automated FIB Liftout (M22) | M22 coupon optimized for automated sample preparation procedures. | 26880 (pack of 10) |
| 25 Tip One-Sided Coupon Holder | Reusable self-aligning microtip stub with spring retention mechanism. | 27213 |
| 25 Microtip Coupon Optimized for Automation | One-sided presharpened microtip coupon optimized for automation. | 28002 (pack of 10); 27181 (single) |
| 25 Flat-Topped Microtip Coupon Optimized for Automation | One-sided flat-topped FIB liftout coupon optimized for automation. | 28001 (pack of 10); 27145 (single) |
| Spare Parts Kit | Kit containing replacement screws, washers, covers, bases and Allen keys. | 24407 |
| ARM™ Replacement Needles | Pre-bent replacement needles for ARM stages. | 23917; 24780 |
| Cu Spring Clip Replacement | Replacement clips for spring clip microtip stubs. | 24501 |
| Small ID Sample Stub | Copper crimp sample stub with 0.4 mm ID. | 21609 |
| Medium ID Sample Stub | Copper crimp sample stub with 1.0 mm ID. | 22933; 24508 (short version) |
| Large ID Sample Stub | Copper crimp sample stub with 1.4 mm ID. | 21610 |
| Grooved Sample Stub, 0.9 mm ID | Grooved copper crimp sample stub. | 25961 |
| Grooved Sample Stub, 0.5 mm ID | Grooved copper crimp sample stub. | 25963 |
| 3DAP Sample Stub (Ni Crimps) | Precision nickel crimp for use in 3DAP systems. | 23863 |
| Specimen, Test, Aluminum | Aluminium test specimen for LEAP calibration and testing. | 21634 |
| Specimen, Test, Stainless-Steel | Stainless-steel test specimen for LEAP calibration and testing. | 21635 |
| Specimen, Test, Tungsten | Tungsten test specimen for LEAP calibration and testing. | 21636 |
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