LEAP 6000 XR
The first 3D Atom Probe with combined voltage & laser pulsed operation
The LEAP 6000 XR™ inherits key features from previous APT generations, adding deep UV laser pulsing to the proven local electrode design to deliver higher yield and data quality. Through compatibility with the microtip array and a redesigned optical system, the LEAP 6000 XR provides enhanced ease of use and the potential for fully automated operation.
Product Details
Microtip compatible and capable of utilizing advanced automation features, CAMECA’s LEAP 6000 XR offers improved yield and higher sensitivity for your research applications.
It introduces a new operational mode that applies both a laser pulse and a voltage pulse to the specimen at the same time. Since the majority of the spectral background is caused by out of time evaporation due to the standing voltage, this results in a significantly lower background throughout the experiment.
Deep UV laser wavelength providing Improved yield and a more accurate reconstruction
Synchronous voltage plus laser pulsing (VpL) operation which results in higher sensitivity and easier peak identification
LEAP Automation which enables off-hours and unattended operation for a faster return on investment
Benefits
Discover the key advantages that set our solution apart. From increased efficiency to exceptional support, these benefits are designed to deliver real value and help you achieve more with confidence.
Webinars
View our on demande webinars.
Atom Probe Tomography of Porous Solid Oxide Fuel Cells
Join Lazar Vucicevic and Dr. Katherine Rice to discover how atom probe tomography reveals microstructural evolution in porous SOFC electrodes - and how new laser technology improves yield.
High Impact Research: Composition Metrology & Correlative Microscopy of Wide Bandgap Semiconductors with APT
In the last decade, atom probe tomography (APT) has emerged as a valuable tool in the study of III-N semiconductors. In optoelectronics, it has provided insights into the nanostructure of light emitting diodes (LEDs), laser diodes and microwires. In nano-electronics, it has allowed insights into doping and alloying effects in transistors...
An Introduction to Atom Probe Tomography and its Applications
CAMECA's Dr. Katherine Rice presents an Introduction to Atom Probe Tomography in a webinar hosted by the Materials Research Society. If you're looking for an easy introduction to the technique, an overview of APT instrumentation and the benefits to your institution or organization, this webinar is a great starting point. Packed with examples, it's the perfect primer on this powerful technology.
Introduction of 6000 Generation : Invizo 6000 & LEAP 6000 XR
Following the introduction of the Local Electrode Atom Probe (LEAP) in 2003, Atom Probe Tomography (APT) has become a standard material science method enabling 3D nanoscale compositional characterization of metals and alloys, ceramics, semiconductors, biomaterials and geological materials.
What to Expect When You're Expecting an Atom Probe
This webinar will discuss the typical process that happens with purchasing an atom probe microscope. We will present best practices, equipment, and personnel you will need as well as common pitfalls that can complicate the whole process.
Downloads
Application Note
01 - Carbon Segregation with LEAP and STEM
07 – LED Device Engineering
11 - 3D FinFET: Analysis of a 14 nm Device
15 - Correlative Grain Boundary Characterization
16 - Optoelectronics: Dopant Distribution in ALD‑grown ZnO
18 - Paleoclimatology: Organic Matrices in Biogenic Carbonates
20 - APT‑STEM Imaging for Enhanced 3D Reconstruction
26 -Stronger High‑Temperature Light Alloys Enabled by APT
27 - Nanogeochronology by Atom Probe Tomography
32 - Biomedical: Developing APT for Bone Tissue Repair Medical Devices
33 - Grain Boundary Analysis in Ni‑based Superalloys
34 - Hydrogen Embrittlement Studies
37 – Off‑the‑Shelf FinFET Device Characterization by APT
Interview
Making Green Steels with Hydrogen
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