IMS 8f

Versatile Magnetic Sector SIMS Automated

The IMS 8f is the latest version of our successful IMS xf Secondary Ion Mass Spectrometer (SIMS) product line. Designed to deliver high precision elemental and isotopic analyses with increased ease-of-use and productivity, it has been optimized for challenging applications such as glass, metals, ceramics, Si-based, III-V and II-VI devices, bulk materials, thin films... fulfilling industry requirements for efficient device development and process control.

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Product Details

Overview

Less tuning. More understanding.

IMS 8f automates primary and secondary column alignment through a streamlined workflow, shortening time to results and delivering more consistent operating conditions. The result is better day-to-day reproducibility and more productive use of operator time, allowing greater focus on analytical insight rather than instrument setup.

From complex interfaces to deep distributions

Advanced semiconductor technologies and emerging materials require analytical solutions capable of addressing increasingly diverse characterization challenges. Building on the proven performance of magnetic-sector dynamic SIMS, IMS 8f introduces a new platform architecture designed to extend analytical flexibility across a broad range of applications. Enhanced capabilities for light-element analysis, deep implant characterization, denser depth sampling and expanded operating conditions provide greater versatility for investigating contamination, buried interfaces, multilayer structures, dopant distributions and novel material systems. From semiconductor process development to advanced materials characterization, IMS 8f is designed to support evolving analytical requirements.

A New Dynamic SIMS Platform for Evolving Analytical Challenges

IMS 8f combines automated operation, enhanced analytical flexibility and a modernized platform architecture in a new generation of Dynamic SIMS designed for semiconductor and advanced materials characterization.

Key Features

Software

Upgrade Kits

Specific to IMS 6f users: extend the lifetime of your instrument with our IMS 6f overhaul program:
IMS 6f ion microprobes are robust, but old instruments whose electronic components are becoming obsolete. To minimize the risk of long, non-scheduled downtime, CAMECA offers an IMS 6f overhaul program, that will fully rejuvenate your instrument with a complete new electronics system, pumping and vacuum, new hardware, full automation, user-friendly acquisition and processing software, etc...
Download the IMS 6f-E7 upgrade flyer for all details of this upgrade and its benefits in terms of performance, productivity, ease-of-use, and of course, uptime and sustainability.

Click button below to view upgrade options available for IMS 6f-E7 and 7f:

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Benefits

Discover the key advantages that set our solution apart. From increased efficiency to exceptional support, these benefits are designed to deliver real value and help you achieve more with confidence.