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Company Overview

CAMECA is a world-leading supplier of high-performance analytical instrumentation and metrology solutions for development, production support, and basic materials research.

 

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Who we are

Our Mission

CAMECA delivers leading-edge analytical solutions down to nanoscale enabling insights that unlock technological barriers in materials research, semiconductor and life science.

Our Products

Because we believe that science contributes to environmental and societal challenges, CAMECA creates innovative and unique microanalysis solutions. In this way, we help Research and Industry push the boundaries of knowledge of matter.

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History

From cinema to cells - A history of powering discovery through precision engineering

Icon Innovation

Innovation

World-leading innovation in APT, SIMS and Ion Source technology

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Quality

Certified quality and performance, from design, to manufacturing to support

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Support 

Supporting customers through our network of global sales and services locations

CAMECA Company Timeline 

CAMECA is a global leader in precision scientific instrumentation and semiconductor metrology solutions. We deliver cutting-edge technologies for advanced material characterization, backed by expertise in mechanics, optics, and electronics. Our ISO-certified facilities in France and the USA ensure world-class design, manufacturing, and service. With a team of 300+ professionals across the globe, CAMECA combines innovation in ion and electron source technology with a commitment to supporting research and industry, driving progress and enabling breakthroughs in science and technology.

1950s innovation – Electron Probe Microanalysis (EPMA) technology icon
1950
Innovation Begins
Pioneered Electron Probe Microanalysis (EPMA) technology
1950
1960s milestone – Secondary Ion Mass Spectrometry (SIMS) development icon
1960s
Global Leadership in SIMS
Developed Secondary Ion Mass Spectrometry (SIMS)
1960s
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1978
IMS 3f
First model of the successful IMS xf series
1978
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1990s–2000s
Breakthrough Technologies
Introduced Shallow Probe LEXES, IMS Wf & SC Ultra, low-impact energy SIMS for semiconductor applications, IMS 1280, large-geometry SIMS for geosciences and U Isotope Analysis and First NanoSIMS instrument commercially available (NanoSIMS 50)
1990s–2000s
AMETEK company logo centered inside a red circle
2005
Acquisition of Atomika
QUAD SIMS technology added to SIMS portfolio
2005
AMETEK company logo centered inside a red circle
2007
Joining AMETEK
Acquired by AMETEK, becomes part of AMETEK’s organization
2007
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2010
Acquisition of Imago Scientific Instruments
Adds Atom Probe Tomography to the material characterization portfolio
2010
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2012
Launch of the IMS 7f-Auto
Launch of the IMS 7f-Auto for Versatile Semiconductor Applications
2012
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2015
Launch of the SIMS 4550
Quadrupole SIMS for dopant depth profiling and thin layer analysis in semiconductors
2015
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2016
Launch of the IMS 1300-HR³
For High Reproducibility at High spatial Resolution and High mass Resolution
2016
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2021
Introduction of Invizo 6000
The 3D Atom Probe with the largest field of view and LEAP 6000 XR the first Atom Probe with combined voltage & laser pulsed operation
2021
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2022
AKONIS
SIMS Excellence Brought To The Fab
2022
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2024
Introduction of the NanoSIMS-HR & Acquisition of Polygon Physics
Launch of NanoSIMS-HR with unprecedented 30 nm lateral resolution and cold stage
2024
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2026
Introduction of the NanoSIMS Cryo and the IMS 8f
Unveiling the future of NanoSIMS and Dynamic SIMS
2026
Since we started to work with CAMECA IMS 1280 in 2008, we have developed U-(Th)-Pb dating procedures on more than ten kinds of accessory minerals to broaden understanding of in-situ geochronology. The good performance of this instrument made it feasible to date with as small as 2 micron-spot size. We bought the second one (IMS 1280-HR) in 2013 because of the increasing workload. These two instruments are serving a wide range of scientists worldwide. "
Prof. Qiuli Li
Institute of geology and geophysics, Chinese Academy of Sciences, Beijing, China
CAMECA large-radius SIMS instruments define state of the art for in situ analysis of isotope ratios from the smallest possible spots. The WiscSIMS IMS 1280 routinely produces better precision and accuracy than previously imagined, enabling new areas of enquiry and discovery from paleoclimatology to zircons to meteoritics. "
Prof. John Valley & Noriko Kita
University of Wisconsin, Madison, USA
The LEAP 4000HR has allowed us to see radioisotope geologic time in 3D for the first time. It is revolutionizing our view of natural materials, allowing us to use our macro-scale mapping approaches at the scale of the mineral lattice. It is an exciting time to be an Atom Probe geoscientist! "
Prof. Desmond Moser
University of Western Ontario, USA
 The CAMECA LEAP with UV laser pulsing is a powerful tool for 3D nanoscale geochemistry studies. Its introduction just a few years ago has enabled the analysis of a broad range of geological materials, including ground-breaking imaging of sub-micron isotopic distributions. Since the Geoscience Atom Probe Facility was established at Curtin University in 2015, researchers from around the world have visited the facility to make use of the LEAP’s capabilities, resulting in many new insights into geological processes active at the nanoscale. "
Dr. David Saxey
Department of Physics and Astronomy & Curtin University, Perth, Western Australia
As a scientist interested in interfacial phenomena, the LEAP® 5000 has provided a transformative microscope in quantifying elemental behavior across of a variety of material surfaces. This has enabled new understanding of material’s chemical structure and its effect in controlling properties, wether that be electrical, magnetic, optical or mechanical. "
Prof. Gregory B. Thompson
University of Alabama, USA
Our LEAP® gives us fundamental understanding of atomic interactions between alloying elements in microalloyed steels. Particularly the clustering behaviors of light elements detected must lead to development of a new class of low-alloy steels by controlling heterogeneity contained in a classical metallic solid solution. "
Prof. Tadashi Furuhara
Institute for Materials Research, Tohoku University, Japan
Our IMS 7f instrument was just being installed when the 3rd November 2011 earthquake happened. Despite seismic intensity of 7 and subsequent nuclear plant trouble, our university being located 100 km from Fukushima, CAMECA staff could solve the vibration related molecular pump issues and perfectly install the instrument. Since then, the Tohoku University IMS 7f has proven to be a robust machine, stable over time and incredibly versatile. We use it successfully for a wide variety of challenging microanalytical tasks such as characterization of diffusion in solid materials for fuel cells, depth profiles for multi layers in electric devices, behaviors of additional elements in steels or ceramics, dating in geoscience, isotopes analysis in biology... "
Dr. Takamichi Miyazaki
Tohoku University School of Engineering, Japan
As a materials scientist focused on understanding the role of microstructure and environment in materials performance, the unique microchemical information attainable using the NanoSIMS is providing unique insights into hydrogen-assisted fracture that cannot be obtained via other analytical techniques. Our research using NanoSIMS has demonstrated the localization of hydrogen in the plastic zone ahead of fatigue cracks in austenitic stainless steel. NanoSIMS is the perfect complement to advanced analytical electron microscopy and atom probe tomography, as it provides essential information concerning elemental segregation at spatial resolutions necessary for correlation with the general microstructure. "
Dr. Greg McMahon and Prof. Grace Burke
Materials Performance Centre, University of Manchester, United Kingdom
Our IMS 7f gives us analytical capabilities for highly sensitive quantitative analysis of light elements, particularly Oxygen and Hydrogen, in Zr alloys after exposure in high temperature steam environment simulating conditions in VVER nuclear reactors. In combination with the CAMECA APM software we can use our IMS 7f for fast search, identification, and isotopic analysis of micrometer size dust particles containing nuclear material – a capability that we never had before. "
Dr. Jan Lorincik
Research Center Rez, Czech Republic
 Since 1999 CAMECA IMS 6f has been used for the research on isotope ratio analysis of uranium in individual particles in the environment at JAEA (Japan Atomic Energy Agency). These analysis data are regularly provided to IAEA (International Atomic Energy Agency) and are highly evaluated by IAEA. End of 2017 we have newly introduced a CAMECA IMS 1300–HR3, which realizes more precise isotope ratio measurements, and have started new researches. It is impossible to perform without using CAMECA’s SIMS instruments with high performance and reliability. They continue to be widely utilized in the field of nuclear sciences and environmental sciences. "
Dr. Fumitaka Esaka
Japan Atomic Energy Agency, Ibaraki, Japan
 Predicting the in-service structural integrity of components in nuclear reactors is immensely challenging but essential from both safety and economic perspectives. The CAMECA LEAP provides an unrivalled capability to characterise the 3D atomic-scale irradiation damage caused by the interaction between energetic neutrons and atoms in structural components. The resultant microstructural data are used to underpin mechanistic models of the degradation processes and hence support safety cases for continued operation of nuclear reactors world-wide. "
Prof. Jonathan Hyde
National Nuclear Laboratory, U.K.
IMS 8f

SIMS Products

Find out why we are a world leader for SIMS solutions

Since pioneering Secondary Ion Mass Spectrometry in the 1960s, CAMECA has developed a complete SIMS product line. Each of our high-end instruments ensures the best performance for a given application.

Explore SIMS Products
CAMECA LEAP 5000 XR atom probe microscope system with control workstation and multiple display monitors

APT Products

Explore how APT capabilities can benefit your application

Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale

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CAMECA is a business unit of AMETEK, Inc.

 

CAMECA joined AMETEK Inc., in August 2007.

 

AMETEK Inc. is a leading global provider of industrial technology solutions serving a diverse set of attractive niche markets with annual sales over $7.0 billion.

 

AMETEK consists of two operating groups, both with highly-differentiated technology and leading positions in niche markets:

 

  • Electronic Instruments — a worldwide leader in the design and manufacture of advanced analytical, test and measurement instrumentation for the energy, aerospace, power, research, medical and industrial markets.
  • Electromechanical — a differentiated supplier of automation and precision motion control solutions, and highly engineered electrical interconnects, specialty metals and thermal management systems.

 

AMETEK has been publicly traded on the NYSE since 1930 and is a component of the S&P 500.

Read about our products and research

Find out what CAMECA can do for you with our free application notes, webinars, interviews and white papers.

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Crystalline silicon surface processed with femtosecond laser under helium atmosphere for SIMS analysis.
Newsletter

Helium as a Protective Gas in Femtosecond Laser Processing of Crystalline Silicon: Tracking He Incorporation with High‑Sensitivity SIMS

April 7, 2026

Helium as a Protective Gas in Femtosecond Laser Processing of Crystalline Silicon: Tracking He Incorporation with High‑SensitAs femtosecond laser processing continues to expand in silicon research, th...
Read More
Lake Cadagno sulfur isotope evolution study using SIMS analysis.
Newsletter

Decadal, Sediment-Driven Sulfur Isotope Evolution in Lake Cadagno: Microscale Insights from SIMS

March 4, 2026

The sulfur isotope composition (δ³⁴S) of sedimentary pyrite is widely used to reconstruct the past global marine sulfur cycle. However, as highlighted in a recent study by Dupeyron et al. (2025), loca...
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Semiconductor wafer with integrated InGaAs heterostructures used for SIMS and HAXPES analysis of zinc dopant diffusion across buried interfaces.
Newsletter

Tracing Zinc in InGaAs Heterostructures: Understanding Dopant Diffusion Across Buried Interfaces Using SIMS and HAXPES

January 30, 2026

As compound semiconductor devices grow more complex, the precise control of dopants, especially across multilayer structures, remains essential to ensure performance and reliability. In particular, un...
Read More
Satellite image of a large lake system illustrating regional water cycle dynamics and watershed hydrology.
Newsletter

Hurry Up, Earth’s Water Cycle is Ahead of Schedule!

January 30, 2026

Origins of Earth’s Hydrological CycleWater is essential for life on Earth, and understanding its origins is key to explaining how life began....
Read More
Probing novel therapeutics at molecular level
Case Study

SUCCESS STORY: Probing cosmochemical conundrums with a CAMECA SIMS at the University of Hawai‘i

NanoSIMS case study highlighting isotope research at the University of Hawaii....
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Illustration of a girl taking CAMECA e-learning training programs

Learn from Experts

We offer training for all instruments and experience levels - online or at your lab - to help you work efficiently and get the most from your system.

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