Materials Analysis in Nuclear Science with Dynamic SIMS
SIMS, EPMA and APT solutions for nuclear materials research and safeguards.
The Dynamic SIMS (Secondary Ion Mass Spectrometry) technique is routinely used for a variety of nuclear science and engineering applications.
Download our application notes to learn more:
> SIMS for Materials Analysis in Nuclear Science
> SIMS Applications to Nuclear Science: Fission Products Behavior
> Radiation Protection: Intracellular uranium detection with SIMS
Offering extreme sensitivity, high depth and lateral resolution together with high throughput, Dynamic SIMS can be applied to:
> Characterization of plasma facing materials in fusion devices
> Control of thermal and irradiation effects on fission products
> Investigation of long-term behavior of nuclear materials for safe waste disposal
> Study of uranium accumulation processes in human tissues and cells,
and more!
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