Our Secondary Ion Mass Spectrometers are a world reference, combining unequaled sensitivity and detection limits (even on light elements) with high productivity.
Exclusively developed by CAMECA, Atom Probe Tomography instruments offer extensive capabilities for nanoscale 3D imaging and compositional measurements.
Based on a unique, patented mono-cavity Electron Cyclotron Resonance technology, the CAMECA sources generate beams of ions or electrons of any shape and size.