July 2019

 
SIMS imaging of III-IV solar cells
SIMS 3D image reconstruction of III-V solar cells

The development of single-crystal GaAs thin films on low cost flexible substrates is an attractive approach to reduce the high cost of III-V solar cells and can pave the path for roll-to-roll manufacturing of flexible III-V multijunction solar cells for the mainstream domestic PV market. Optimization of sample composition and doping concentration, as well as reduced impurity incorporation, are essential for improving performance and reliability of such devices. In this study, SIMS measurements were performed in flexible III-V GaAs solar cell structures on metal substrates. Using the SIMS scanning ion imaging capabilities, a 3D image reconstruction was obtained for matrix and contaminant species in a multilayered GaAs/AlAs/GaAs/Ge sample.

Courtesy of Pavel Dutta, Monika Rathi, Devendra Khatiwada, Carlos Favela, Sicong Sun, Chuanze Zhang, Venkat Selvamanickam, Department of Mechanical Engineering, Advanced Manufacturing Institute (AMI), University of Houston, USA.