Dr. David J. Larson of CAMECA Instruments to Become MSA Fellow

Friday, April 13, 2018

Contact: Steve Foldvari +1-608-229-1486, steve.foldvari@ametek.com

Dr. David J. Larson of CAMECA Instruments to Become MSA Fellow
Society’s Distinguished Scientist Award to Be Presented to 2018 Fellows on August 6 during Plenary Session of M&M 2018 in Baltimore

MADISON, WI – CAMECA Instruments, Inc., the world leader in elemental and isotopic microanalysis, is proud to announce that Dr. David J. Larson, Director of Scientific Marketing for CAMECA, will become a Microscopy Society of America (MSA) Fellow at its annual meeting on August 6, 2018 in Baltimore, Maryland.

The MSA is a non-profit organization dedicated to the promotion and advancement of techniques and applications of microscopy and microanalysis in all relevant scientific disciplines. The designation "MSA Fellow" recognizes those who have been conferred the Society's Distinguished Scientist Award, as well as senior distinguished members of the Society who have made significant contributions to the advancement of the field of microscopy and microanalysis through a combination of scientific achievement and service to the scientific community and to the Society itself.

This prestigious appointment is restricted annually to 0.5% of total MSA membership. Dr. Larson was selected for “his pioneering contributions to the development of atom probe science and technology, especially its application to complex materials systems, and for his many contributions to the Society.”

Dr. Larson received his PhD degree from the University of Wisconsin and is currently the President of the International Field Emission Society. Prior to joining CAMECA, he held staff positions at Seagate Technology and Oak Ridge National Laboratory and was a U.S. National Science Foundation International Research Fellow at the University of Oxford (Wolfson College).

Dr. Larson’s previous awards include the Burton Medal (Microscopy Society of America), Honorary Staff (University of Sydney), the Cosslett Award (Microbeam Analysis Society), Visiting Scholar (Corpus Christi College, Oxford), the Innovation in Materials Characterization Award (Materials Research Society), and the President’s Award (University of Wisconsin - Eau Claire). He has more than 300 publications and eight patents.

“I am very pleased and honored to be included in the list of scientists that the Microscopy Society of America has designated as Fellows,” comments Dr. Larson. “Since 1942, MSA has supported, promoted, and pioneered the development and application of microscopy. I am proud to have contributed to a very small part of that.

“From a Nobel Prize in 1986 (shared between the scanning tunneling microscope and the electron microscope) to another in 2017 (for cryo-electron microscopy), scientists in the field of microscopy and within MSA have continually pushed the boundaries of scientific knowledge,” he adds.
Microscopy & Microanalysis 2018 runs from August 5 to 9 at the Baltimore Convention Center. CAMECA will be in Booth 524.

About Atom Probe Tomography
Developed and manufactured exclusively by CAMECA, atom probe microscopes are used by the most prestigious research and development laboratories around the world. Atom probe tomography (APT or 3D APT) is the only materials analysis technique that offers extensive capabilities for both 3-D imaging and chemical composition measurements at the atomic scale.

The technique has contributed to many major advances in materials science since its development in the 1960s.
CAMECA’s Atom Probe Tomography product line comprises two families: the LEAP 5000 (Local Electrode Atom Probe) family and the more recently launched EIKOS family. LEAP provides the fastest, most sensitive 3D imaging and analysis with nanoscale resolution across the widest range of applications (metals, oxides, ceramics, advanced energy storage materials, semiconductors and electronics, bio-minerals and geochemistry). The EIKOS family offers accessibility to atom probe tomography with improved ease of use and a low cost of ownership for both general research and industrial applications.

CAMECA has more than 60 years of experience in the design, manufacture and servicing of scientific instruments for material micro- and nano-analysis. Since pioneering Electron Probe Microanalysis (EPMA) instrumentation in the 1950s and Secondary Ion Mass Spectrometry (SIMS) in the 1960s, CAMECA has remained the undisputed world leader, while achieving numerous breakthrough innovations in such complementary techniques as Low-energy Electron-induced X-ray Emission Spectrometry (LEXES) and Atom Probe Tomography.

With the acquisition of Nu Instruments in 2016, CAMECA strengthened its product offering and technical capabilities in elemental and isotopic mass spectrometry
with Inductively Coupled Plasma Mass Spectrometry (ICP-MS), Glow Discharge Mass Spectrometry (GD-MS) and Thermal Ionization Mass Spectrometry (TIMS).

Headquartered near Paris, CAMECA has additional production facilities in Madison WI, USA, and Wrexham, UK, as well as sales, service and support locations in Brazil, China, Germany, India, Japan, Korea, Russia and Taiwan. CAMECA is a business unit of the Materials Analysis Division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electromechanical products.