CAMECA now offers STRATAGem-SX, a new PeakSight add-on module for optimized thin film analysis.
Based on the world-acclaimed SAMx STRATAGem software, it can be seamlessly integrated to PeakSight, allowing users of CAMECA SX electron microprobes to easily process data for thin film analysis.
Using STRATAGem-SX’s powerful simulation functions, SX users can define the best experimental conditions for the investigation of thin films and stratified samples. From a specific sample description, i.e. layers and substrate description, STRATAGem generates the following plots:
Intensity versus accelerating voltage
Intensity versus maximum ionization potential (Rx)
Intensity versus layer thickness.
STRATAGem-SX is available for users of SX 100, SXFive and SXFiveFE under PeakSight v.6.0 and above. Please contact our sales team for more information.
STRATAGem is a SAMx trademark.