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Seminars on SIMS & APT at University of Toulouse, France
CAMECA and Centre de Microcaractérisation Raimond Castaing, Toulouse, France invite to half-day seminars on Secondary Ion Mass Spectrometry and Atom Probe Tomography on April 6th, 2016.

Both half-day seminars are free of charge, but seat is limited. Register on the Castaing Center web site.

9:30 am - 12 am: SIMS
Dr Paula Peres, SIMS product manager at CAMECA, will give an introduction to the Dynamic SIMS microanalytical technique, present specifics of IMS 7f-Auto and IMS 7f-GEO instrumentation, focusing on analytical performances based on recent applications in semiconductors, PV & LED, materials and nuclear sciences, geo and cosmochemistry, environmental studies. 

Lunch offered by CAMECA

2 pm - 4:30 pm: APT
Dr Peter Clifton, Atom Probe Tomography sales leader at CAMECA, will provide a brief overview of the APT technique and its evolutio. State of the art applications will be presented, ranging from metals, semiconductor device structures analyses to the characterization of ceramics, bio minerals and geological materials.



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