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Workshop on Nano Probe Techniques - Indian Institute of Technology Delhi
CAMECA IIT Delhi Workshop 201414th July 2014: CAMECA inviteed to a one day Workshop on Nano Probe Techniques, co-organized with the NanoScale Research Facility - IIT Delhi and the Materials Research Society of India.

The workshop provided basic and advanced knowledge of Secondary Ion Mass Spectroscopy (SIMS) and Atom Probe Tomography (APT) and its applications. Research scholars and Faculty members working in the area of Physics, Chemistry, Materials Science, Earth Science and Engineering participated.

The technical talks by SIMS eminent experts from all over India covered depth profiling, 2D & 3D imaging, isotopic ratio and mass spectrum analytical outputs.

APT presentations reviewed the extensive capabilities of this revolutionary technique for both 3D imaging and chemical composition at the atomic scale.

Download full programme.

CAMECA workshop at IIT Delhi 



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