Worldwide contacts - Service & Support

AMETEK Materials Analysis Division
Join us at APT&M 2016!
55th-APT&M-2016CAMECA looks forward to welcoming you at booth # 7-8 at the 55th APT&M conference in Hyundai Hotel, Gyeongju, South Korea on June 12-17, 2016. 

Don't miss out on the oral presentations by CAMECA Atom Probe experts, among which:

Monday, 13th June, at 15:15 Hall A:
Counter Electrode Design Considerations in Atom Probe Tomography Microscopes,

Wednesday, 15th June, at 11:40, Hall A:
Using Mass Resolving Power as a Performance Metric in the Atom Probe.

We will also be hosting a friendly social event in appreciation of our customers on Wednesday 15th June during the CAMECA sponsored poster session.

Come and join us :
Location: Hall B, next to the CAMECA sponsored session 
Time: June 15th at 6:30pm!




instruments for research - metrology tools - applications - user publications - news - conferences - company - locations

Atom Probe Tomography (APT) - SIMS - EPMA - LEXES - ICP-MS - GD-MS - TIMS

© 2010-2016 AMETEK, Inc - CAMECA SAS. All Rights Reserved -
privacy - trademarks - sitemap