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Path: Home>News & Events>Conferences>2013

See below major events where CAMECA will be present in 2013. This page will soon be updated with additional conferences!

Geographical listing, click on a region: Americas - Asia Pacific - Europe, Middle East, Africa

Americas

PCSI-40 
Conf on the Physics & Chemistry of Surfaces & Interfaces
APT presentation: Applications to Interfaces
Waikoloa, HI, USA Jan
20-24
ASLO 2013 
Aquatic Sciences Meeting
CAMECA Instruments, Inc. booth
New Orleans, LA, USA Feb
17-22
LPSC 2013
Lunar & Planetary Science Conference
CAMECA Instruments, Inc. booth
The Woodlands, TX, USA Mar
18-22
FRONTIERS 2013
CAMECA Instruments, Inc. booth
> LEXES poster and oral presentation
Gaithersburg, MD, USA Mar
25-28
US SIMS Workshop 
CAMECA Instruments, Inc. booth
> APT and SIMS presentations
Annapolis, MD,
USA
May
13-17
GAC-MAC 2013 
Geological and Mineralogical Assoc. of Canada
CAMECA Instruments, Inc. booth
Winnipeg,
Canada
May
22-24
Surface Analysis 2013 
CAMECA Instruments, Inc. table top
PNNL, Richland,
USA
June
19-22
MetSoc 2013 
Annual Meetings of the Meteoritical Society
CAMECA Instruments, Inc. booth
Edmonton,
Canada
Jul 29
Aug 2
M&M 2013 
CAMECA Instruments, Inc. and Ametek booth
Indianapolis, IN
USA
Aug
4-8
ICNS-10
Int'l Conf. on Nitride Semiconductors
CAMECA Instruments, Inc. booth
Washington DC,
USA
Aug
25-30
SBPMat XII
CAMECA booth
Campos do
Jordao, Brazil
Sep 29
Oct 3
SBMM 2013 
CAMECA Brazil booth
> EPMA presentation
Caxambu,
Brazil
Oct
20-23
AVS 60th Int'l Symposium 
CAMECA Instruments, Inc. booth
Long Beach, CA,
USA
Oct 27
Nov 1
AGU Fall Meeting 2013
American Geophysical Union 46th Fall Meeting
CAMECA Instruments, Inc. booth
S. Francisco, CA
USA
Dec
9-13

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Asia-Pacific

Practical Microscopic Characterization Seminar
CAMECA Japan booth
Tokyo
Japan
Jan 31
SEMICON Korea 2013
CAMECA Korea booth
Seoul
Korea
Jan 30
Feb 1
AMAS XII 
Australian Microbeam Analysis Society Symposium
> SXFive oral presentation
Sydney
Australia
Feb
4-8
MRSI-AGM
Materials Research Sty of India Meeting
AMETEK India-CAMECA sponsorship & booth
Kalpakkam
India
Feb
11-13
12th ISMAS TRICON
Triennial Int'l Conf. on Mass Spectrometry
AMETEK India-CAMECA booth
Goa
India
March
4-8
Chinese Sty Mineralogy, Petrology, Geochemistry 
CAMECA China booth
Nanjing
China
April
22-25
SISS 15 
CAMECA Japan booth
> SIMS & APT oral presentation
Musahino-city
Japan
April
25-26
Japan Society of Microscopy
69th Annual Meeting
CAMECA Japan booth
Osaka
Japan
May
20-22
EMSI
AMETEK India-CAMECA booth
Calcutta,
India
July
3-5
JASIS 2013 
Japan Analytical Scientific Instruments Show
CAMECA Japan booth
Chiba City, 
Japan
Sep
4-6
Japanese Geochemical Sty Meeting
CAMECA Japan booth
Tsukuba City
Japan
Sep
10-13
IUMRS-ICAM2013 & C-MRS 2013 
CAMECA China booth
Qingdao
China
Sep
23-27
SIMS-19
Int'l Conf. on Secondary Ion Mass Spectrometry
CAMECA Korea booth & sponsorship
Jeju
Korea
Sep 29
Oct 4
Korean Surface Science Symposium
CAMECA Korea booth
Boryeong
Korea
Oct
10-12
MRS 2013 Taiwan
CAMECA Taiwan booth
Taipei
Taiwan
Oct
19-21
The 2nd International Molecular Imaging Summit 
CAMECA China booth
Xiamen
China
Oct 30
Nov 1
LSI / Nano Testing Symposium
CAMECA Japan booth
Toyonaka, Osaka
Japan
Nov
6-8
PSA-13 
Int'l Symposium on Practical Surface Analysis
CAMECA Japan booth
Okinawa
Japan
Nov
10-15
National Symposium on Petrology and Geodynamics
CAMECA China booth
Guilin
China
Nov
15-18
International Conference on Surface Engineering
CAMECA Korea booth
Busan
Korea
Nov
18-21
SSSJ Surface Science Sty of Japan Meeting
CAMECA Japan booth
Kobe City
Japan
22 Nov
IWPSD 2013
17th International Workshop on the Physics Semiconductor Devices
CAMECA India booth
Uttar Pradesh
India
Dec
10-13

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Europe, Middle East, Africa

UKSAF Winter Meeting
XRay for Energy Research
Acutance participation
Didcot
UK
Jan 9
INDABA
Development of mining interests in Africa
WIRSAM booth
Cap Town
South Africa
Feb 
4-7
GMM
> Oral presentation
Erlanger
Germany
Feb 28 
EGU 2013
CAMECA Germany booth
> Oral presentation
Vienna
Austria
April
7-12
ImagineNano 2013
Telstar booth
Bilbao
Spain
April
23-26
EMAS 2013
Workshop of the European Microbeam Analysis Sty
CAMECA booth
> SXFive poster and oral presentation
Porto
Potugal
May
12-16 
IGRDM-17
Int'l Group of Radiation Damage Mechanism
CAMECA booth
Embiez
France
May
19-24
ISM - Israeli Sty for Microscopy Conference
Eisenberg Bros. Ltd booth
> APT poster and oral presentation
Safed
Israel
May
29-30
BAGECO
12th Symp. on Bacterial Genetics & Ecology
CAMECA booth
Ljubljana
Slovenia
June
9-13
Scandem 2013
Annual Meeting of the Scandinavian Microscopy Society

CAMECA Germany booth
Copenhagen
Denmark
June
10-14
Nitrides 2013
CAMECA, Ametek Russia booth
Moscow
Russia
June
13-15 
William Smith Meeting
1st Century Geochronology 
CAMECA booth sponsorship
London
UK
June
25-27
SFµ 2013
Sypmposium of the French Microscopy Sty
CAMECA booth
Nantes
France
July
2-5

BGSW7
Biennial Geo-SIMS Workshop
CAMECA Germany booth

Potsdam
Germany
Aug
21-22
Goldschmidt 2013
CAMECA and SPECTRO booth
Florence
Italy
Aug
25-30
MC 2013
Microscopy Conference
CAMECA Germany and EDAX booth
Regensburg
Germany
Aug
25-30
EUROMAT 2013
CAMECA booth
> APT presentation
Seville
Spain
Sep
8-13
DRIP-XV 2013
15th International Conference on Defects – Recognition, Imaging and Physics in Semiconductors
COMEF booth
Warsaw
Poland
Sep
15-19
DMG 2013
German Mineralogical Society Meeting
CAMECA booth & presentation
Tübingen
Germany
Sep
16-19
E-MRS 2013
E-MRS 2013 fall meeting
COMEF booth
Warsaw
Poland
Sep
16-20
ECASIA 2013
CAMECA booth
> APT poster
Cagliari
Italy
Oct
13-18
NANOCON 2013
5th International Conference
SPECION booth
Brno
Czech Republic
Oct
16-18
GN-MEBA 2013
French Sty for Scanning Electron Microscopy & Microanalysis
CAMECA booth
Paris
France
Nov
25-26
MSSA 2013
51st Microscopy Society of Southern Africa Conference
CAMECA booth
Pretoria
South Africa
Dec
3-6
Workshops & Users' Meetings

Lab course NanoSIMS in biogeochemistry
(organized by TU Munchen)
24-28 November, Freising, Germany

4th Australian Atom Probe Microscopy Workshop
(organized by The University of Sidney/ACMM)
24-25 November, Sydney, Australia

6th School on Atom Probe Tomography
(organized by GPM - Université de Rouen)
27-31 October, Rouen, France

NanoSIMS International Workshop
13-14 October, Paris, France

1st South African Electron Probe MicroAnalysis Workshop
(co-organized with Wirsam)
27-28 August, Johannesburg, South Africa

Workshop on Nano Probe Techniques
(co-organized with IIT Delhi & MRS India)
14th July, New Delhi, India

French speaking SIMS users’ meeting
(organized by Institut Jean Lamour & CRPG)
2-3 June, Nancy, France

Indian user meeting
19-22 May, Goa, India

1st South-American Workshop on EPMA
23-24 April, Porto Alegre, Brazil


Recent and submitted CAMECA contributions, a selection:

Lanthanum quantification for optimization of advanced high-k/metal gate stacks using low energy electron X-ray emission spectrometry*
(Poster, AVS, Baltimore, MD, USA, Nov 2014)

Correlative Compositional Analysis of Fiber Optic Nanoparticles*
(Poster & oral, IMC, Prague, Czech Republic, Sep 2014)

Improvements of isotopic ratio reproducibility using EMs, and O- primary beam performance on the NanoSIMS 50L
(Poster, SIMS Europe, Münster, Germany, Sep 2014)

Extremely low impact energy SIMS characterization of graphene*
(Poster, Graphene Week, Gothenburg, Sweden, June 2014)

Characterization of Arsenic PIII Implants in finFET by LEXES & SIMS*
(Oral, IIT, Portland, USA, June 2014)

Implantation & metrology solutions for low energy Boron implant on 450mm wafers*
(Oral, IIT, Portland, USA, June 2014)


New Applications of LEAP Microscopy from Analysis of Quantum Dots to Zircon Crystal Dating*
(Poster, ECASIA, Cagliari, Italy, Oct 13)

New CAMECA IMS 7f-Auto: high throughput & automation*
(Poster, SIMS Int'l Korea, Sep 13)

Quantitative analysis with the CAMECA SXFiveFe at high lateral resolution. Applications to Geochronology & Mineralogy*
(Poster, Goldschmidt, Florence, Italy, Aug 13)

Recent in situ geochronology studies with the CAMECA ion microprobe*
(Poster, William Smith, London, UK, June 13)

Quantitative & reproducible analysis with the CAMECA SXFiveFe at high lateral resolution*
(Poster, EMAS, Porto, Portugal, May 13)

Shallow Probe: non-destructive compositional metrology for films and structures*
(Poster, Frontiers, Gaithersburg, MD, USA, Mar 13)

SIMS analytical technique for characterizing ZnO-based materials*
(Poster, IWZnO, Nice, France, Sep 12)

Quantitative And Repeatable Analysis At High Spatial Resolution With Field Emission Electron MicroProbe*
(Poster, M&M, Phoenix, AZ, USA, July 2012)

Atom Probe Tomography Analysis of Grain Boundaries in CdTe*
(M&M, Phoenix, AZ, USA, July 2012)

Characterization of Si-SiGe Heterostrucrures using SIMS & APT*
(Oral, Silicon 2012, St Petersburg, Russia, June 12)

Characterization of Nitride-based LED materials using dynamic SIMS*
(Poster, ISGN 4, St Petersburg, Russia, June 12)

High precision 4-isotope Sulfur measurements using the CAMECA IMS 1280-HR*
(Poster, Goldschmidt, Montreal, Canada, June 2012)

Atomic Scale Imaging of U, Th & radiogenic Pb in Zircon*
(Oral, Goldschmidt, Montreal, Canada, June 2012)

Nuclear Safeguards applications using LG-SIMS with automated screening capabilities*
(Oral, SIMS Workshop, Philadelphia, USA, May 2012)

Atom Probe Tomography Analysis of Photovoltaic CdTe*
(Poster, IFES, Univ. of Alabama, USA, April 2012)

Coupling identity and metabolic function of single cells in environmental microbiology with NanoSIMS*
(Poster, EMBO, Noordwijkerhout, Netherlands, April 2012)

The Use of LEXES to Measure the Chemical Composition of In-situ Doped Epitaxial SiGe for High Performance CMOS Technology*
(Poster, Frontiers, Grenoble, France, May 2011)


*on request only. Please write to cameca.info@ametek.com

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