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See below major events attended by CAMECA in 2010. We were also represented at many regional meetings not mentioned on this page.
Geographical listing, click on a region: - -
America 2010
41th Lunar & Planetary Science Conference
CAMECA Instruments, Inc. User Reception |
Woodlands, TX
USA |
March
1-5 |
SIMS Workshop
CAMECA Instruments, Inc. booth & sponsorship
> Various SIMS, NanoSIMS & Atom Probe presentations |
Norfolk, VA
USA |
May
16-21 |
ASM 2010
American Society for Microbiology 110th General Meeting
CAMECA Instruments, Inc. booth #204
> NanoSIMS presentation |
San Diego, CA
USA |
May
24-26
|
Advanced Materials Characterization Workshop
CAMECA Instruments, Inc. sponsorship |
Urbana, IL
USA |
June
9-10 |
Goldschmidt 2010
CAMECA Instruments, Inc. booth # 13
> IMS 1280 and NanoSIMS presentations |
Knoxville, TN
USA |
June
13-18 |
Meteoritical Society Meeting 2010
CAMECA Instruments, Inc. sponsorship |
New York City
USA |
July
26-30 |
M&M 2010
CAMECA Instruments, Inc. booth # 559
> 3D Atom Probe & SIMS presentations |
Portland, OR
USA |
Aug
1-5 |
XIX Int'l Materials Research Congress 2010
MRS Mexico
Intercomavex booth |
Cancun,
Mexico |
Aug
15-19 |
ISME 13
International Symposium on Microbial Ecology
CAMECA Instruments, Inc. booth
> Presentation: Single cell environmental microbiology with SIMS |
Seattle, WA
USA |
Aug
22-27 |
AVS 57th Int'l Symposium
American Vacuum Society
CAMECA Instruments, Inc. / El Dorado Sol booth |
Albuquerque, NM
USA |
Oct
17-22 |
GSA 2010
Geological Society of America Annual Meeting
CAMECA Instruments, Inc. booth #727 |
Denver, CO
USA |
Nov
1-3 |
2010 AGU Fall Meeting
American Geophysical Union
CAMECA Instruments, Inc. booth #331 |
San Francisco, CA
USA |
Dec
13-17 |
Asia-Pacific 2010
SEMICON Korea 2010
Booth#1709, Atlantic Hall (CAMECA Korea) |
Seoul
Korea |
Feb
3-5 |
6th International Dyke Conference
CAMECA / Gannon booth and sponsorship |
Varanasi
India |
Feb
4-7 |
EMSI 2010
Int'l Conf. on Advances in Electron Microscopy and Related Techniques
CAMECA / Gannon booth and sponsorship |
BARC, Mumbai
India |
March
8-10
|
IIT 2010
Ion Implantation Technology Conference
> EXLIE SIMS presentation |
Kyoto
Japan
|
June
6-11 |
SISS 12
Int'l Symposium on SIMS & Related Techniques
> SIMS & Atom Probe presentations |
Seikei
Japan
|
June
10-11 |
58th Annual Conference on Mass Spectrometry
organized by the Mass Spectrometry Society of Japan
CAMECA Japan booth
> NanoSIMS in life sciences - invited talk |
Tsukuba
Japan
|
June
16-18 |
2010 China Materials Symposium
CAMECA China booth
> SIMS, NanoSIMS & 3D Atom Probe presentations |
Changsha
China |
June
18-21 |
IFES 2010
52nd International Field Emission Symposium
CAMECA booth
> Atom Probe presentations |
Sydney
Australia |
July
5-8 |
17th IEEE IPFA Symposium
Int'l Symposium on the Physical Failure of Integrated Circuits
HiTech Instruments booth |
Suntec
Singapore |
July
5-9 |
ACMM 2010
21st Australian Conference on Microscopy & Microanalysis
CAMECA booth |
Brisbane
Australia |
July
11-15
|
JAIMA EXPO 2010
Japan's Exposition of Analytical Instruments
CAMECA Japan booth |
Makuhari
Japan |
Sep
1-3
|
Geochemical Society of Japan
Annual Meeting 2010
CAMECA Japan booth |
Rissho Univ. Saitama
Japan |
Sep
7-9 |
Symposium on Surface Analysis
CAMECA Korea booth |
Gyeongju
Korea |
Oct
3-6 |
Chinese Electron Microscopy Society
CAMECA China / EDAX booth |
Hangzhou
Korea |
Oct
8-13 |
PV Taiwan
Taiwan Int'l Photovoltaic Forum & Exhibition
CAMECA Taiwan / EDAX: booth #541 |
Taipei
Taiwan |
Oct
26-28
|
Symposium on Microbial Ecology
CAMECA Japan booth |
Tsukuba
Japan |
Nov
24-26 |
Korea Society of Microscopy Annual Conference
CAMECA Korea booth |
Pohang
Korea |
Nov
25-26 |
Korean Institute of Surface Engineering Meeting
CAMECA Korea booth |
Incheon
Korea |
Nov
25-26 |
Europe 2010
EMPG 2010
Experimental Mineralogy Petrology Geochemistry XIII
CAMECA booth
> NanoSIMS & IMS 7f-GEO presentations |
Toulouse
France |
April
12-14 |
EMAS Regional Workshop
CAMECA booth |
Amsterdam
Netherlands |
April
25-28 |
SCANDEM 2010
Annual Conf. of the Scandinavian Sty for Electron Microscopy
> NanoSIMS & 3D Atom Probe presentations |
Stockholm
Sweden |
June
8-10 |
Microscience 2010
ISS booth |
London
Great Britain |
June 29
July 1 |
E-MRS Warsaw
Comef booth |
Warsaw
Poland |
Sep
13-17 |
SIMS Europe 2010
European Meeting on Secondary Ion Mass Spectrometry
CAMECA GmbH booth
> Presentation: Depth profiling in organic materials based structures by EXLIE SIMS |
Muenster
Germany |
Sep
19-21 |
DMG 88. Jahrestagung
Yearly Meeting of the German Mineralogy Society
CAMECA GmbH booth
> Presentation: IMS 1280-HR, an improved model of ultra high sensitive and precise SIMS |
Muenster
Germany |
Sep
19-22 |
AOFA 16
Workshop on Applied Surface Science
CAMECA GmbH booth |
Kaiserlautern
Germany |
Sep
27-29 |
Matériaux 2010
Conference of the French Federation of Materials
CAMECA booth#29
> SIMS & 3D Atom Probe presentations |
Nantes
France |
Oct
18-22 |
Symposium on International Safeguards
Organized by IAEA
CAMECA sponsoorship & booth |
Vienna
Austria |
Nov
1-5
|
GN-MEBA 2010
Annual Workshop of the French Sty for Scanning Electron Microscopy & Microanalysis |
Paris
France |
Dec
2-3 |
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Recent and submitted CAMECA contributions, a selection:
Depth profiling in organic materials based structures by extreme low energy dynamic SIMS*
(SIMS Europe 2010, Muenster, Germany)
The ATOM Project and the Atomscope Concept (joint ORNL-CAMECA presentation at IMC 17, Rio, Brazil)
> Download pdf (1.5MB)
Towards an improved IMS 1280 model: the IMS 1280-HR*
(Goldschmidt 2010, Knoxville)
New applications in Atom Probe Tomography
(SCANDEM 2010, Stockholm)
> Download pdf (1.8MB)
Single Cell Environmental Microbiology with Secondary Ion Mass Spectrometry
(ASMicrobiology 2010, San Diego)
> Download pdf (1.8MB)
Review of Atom Probe Tomography Applications for Semiconductor Materials
(SIMS Toronto 2009)
> Download poster (2.4MB)
SIMS Applications for Photovoltaic Technology Development*
(SIMS Toronto 2009)
Advanced SIMS Quantification in the First Few nm of B , P and As Ultra Shallow Implants*
(SIMS Toronto 2009)
Quantitative Analysis of SiON Layers using ULE Cs+ and Negative Secondary Ions*
(SIMS Toronto 2009)
High precision U-Pb dating analyses with the CAMECA IMS 1280*
(Goldschmidt 2009)
Single Cell Environmental Microbiology with NanoSIMS
(ASMicrobiology, Boston 2009)
> Download poster (2.5MB)
*on request only. Please write to gennev@cameca.com
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