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Semiconductors
High depth resolution analysis of Si/SiGe multilayers with the atom probe. Sebastian Koelling, Matthieu Gilbert, Jozefien Goossens, Andriy Hikavyy, Olivier Richard, Wilfried Vandervorst. Applied Physics Letters 95, 144106 (2009)
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Three-dimensional atomic-scale imaging of boron clusters in implanted silicon. O. Cojocaru-Miredin, E. Cadel, F. Vurpillot, D. Mangelinck and D. Blavette. Scripta Materialia 60, pp 285–288 (2009)
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Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide. R. Lardé, E. Talbot, F. Vurpillot, P. Pareige, G. Schmerber, E. Beaurepaire, A. Dinia, V. Pierron-Bohnes. Journal of Appplied Physics 105, 126107 (2009)
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Study of Formation Mechanism of Nickel Silicide Discontinuities in High Performance CMOS devices. S. Kudo et al. IEEE 47th Annual International Reliability, Physics Symposium, Montreal (2009)
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Inhomogeneity of a highly efficient InGaN based blue LED studied by three-dimensional atom probe tomography. G. H. Gu, C. G. Park, and K. B. Nam. Phys. Status Solidi RRL 3, No. 4, 100– 102 (2009)
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Failure mechanisms of silicon-based atom-probe tips. S. Kolling, W.Vandervorst, Ultramicroscopy 109 pp 486–491 (2009)
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Atomic-scale redistribution of Pt during reactive diffusion in Ni (5%Pt)–Si contacts. O.Cojocaru-Miredin, E.Cadel, D.Blavette, D.Mangelinck, K.Hoummada, C.Genevois, B. Deconihout, Ultramicroscopy, accepted 17 Feb 2009
Growth of Si nanowires on micropillars for the study of their dopant distribution by atom probe tomography. T. Xu, J. P. Nys, B. Grandidier, D. Stievenard, Y. Coffinier and R. Boukherroub, R. Larde, E. Cadel, and P. Pareige. J. Vac. Sci. Tecnol. B 26 (6), pp 1960-1963 (2008)
LA-WATAP & SIMS as complementary techniques for quantitative measurement of nanometer structures. I. Martin, L. Renaud, A. Merkulov, P. Peres, M. Gilbert, E. Cadel, B. Deconihout, Presentation for SIMS XVI, Kanazawa, Japan, Nov 2007
Snowplow effect and reactive diffusion in the Pt doped Ni-Si system. O. Cojocaru-Mirédin, D. Mangelinck, K. Hoummada, E. Cadel, D. Blavette, B. Deconihout, C. Perrin-Pelligrino, Scripta Mater. doi: 10.1016/j.scriptamat.2007.05.007 (2007)
First stage of the formation of Ni silicide by atom probe tomography. K. Hoummada, E. Cadel, D. Mangelinck, C. Perrin-Pellegrino, D. Blavette, B. Deconihout, Applied Physics Letter 89, 181905 (2006)
Materials Science
Laser-assisted three-dimensional atom probe analysis of dopant distribution in Gd-doped CeO2. F.Li, T.Ohkubo, Y.M.Chen, M.Kodzuka, F.Ye, D.R.Ou, T.Moria and K.Hono. Scripta Mater. 63, pp. 332-335 (2010)
Intergranular segregation of Cr in Ti stabilized low Cr ferritic stainless steel. Jeong Kil Kim, Byeong-Joo Lee, Bong Ho Lee, Yeong Ho Kim and Kyoo Young Kim. Scripta Materialia (2009)
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Structural analysis of a (Pt/Co)3 /IrMn multilayer: Investigation of sub-nanometric layers by tomographic atom probe. R. Lardé, L. Lechevallier, A. Zarefy, A. Bostel, J Juraszek, J. M. Le Breton, B. Rodmacq and B. Dieny. Journal of applied Physics 105, 084307 (2009)
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Characterization of (Pt 2nm/Co 0.4nm)3/Ptx /IrMn 7nm multilayers by tomographic atom probe: On the role of a Pt spacer. A. Zarefy, R. Lardé, L. Lechevallier, F. Cuvilly, J. M. Le Breton, V. Baltz, B. Rodmacq, and B. Dieny Journal of applied Physics 105, 103912 (2009)
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Investigations of the nitrided subsurface layers of an Fe–Cr-model alloy. P.Jessner, R. Danoix, B. Hannoyer, F. Danoix. Ultramicroscopy 109, pp 530–534 (2009)
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Laser-assisted atom probe analysis of zirconia/spinel nanocomposite ceramics. Y.M. Chen, T. Ohkubo, M. Kodzuka, K. Morita and K. Hono. Scripta Materialia (2009)
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Structural investigation of TbCo2/Fe magnetostrictive thin films by Tomographic Atom Probe and Mössbauer spectrometry. A. Grenier, R. Lardé, E. Cadel, J.M. Le Breton, J. Juraszek, F. Vurpillot, N. Tiercelin, P. Pernod, J. Teillet, Journal of Magnetism and Magnetic Materials 310 pp. 2215–2216 (2007)
Comparative study of the beta''-phase in a 6xxx Al alloy by 3DAP and HRTEM. H.K. Hasting, W. Lefebvre, C. Marioara, J.C. Walmsley, S. Andersen, R. Holmesstad, F. Danoix, Surface and Interface Analysis, 39 pp. 189-194 (2007)
Three-dimensional atomic-scale imaging of impurity segregation to line defects. D. Blavette, E. Cadel, A. Fraczkiewicz, A.Menand, SCIENCE, volume 286, pp 2317-2319, 17 dec 1999
Atomic scale investigation of boron nanosegregation in Fe Al intermetallics. E. Cadel, D. Lemarchand, A.-S. Gay, A. Fraczkiewicz, D. Blavette, Scripta Materialia, vol. 41, n°4, p. 421 (1999)
Precipitation in 9Ni-12Cr-2Cu maraging steels. K. Stiller, M. Hättestrand and F. Danoix, Acta Mater. Vol. 46, n° 17, p. 6063 (1998)
Precipitation of copper in iron under swift ion irradiations. A. Barbu, P. Pareige, V. Jacquet, Nucl. Instr. and Meth. B, vol. 146, p. 278 (1998)
Three-dimentional imaging of chemical order with the tomographic atom probe. D. Blavette, B. Deconihout, S. Chambreland, A. Bostel, Ultramicroscopy, vol. 70, p. 115 (1998)
Investigation of some selected metallurgical problems with the tomographic atom probe. B. Deconihout, A. Bostel, P. Bas, S. Chambreland, L. Letellier, F. Danoix, D. Blavette, Appl. Surf. Sci., vol. 76/77, p. 145-154 (1994)
An atom probe for three-dimentional tomography. D. Blavette, A. Bostel, J.M. Sarrau, B. Deconihout, A. Menand, NATURE, vol. 363, p. 432 (1993)
Instrumentation
Correlated field evaporation as seen by atom probe tomography. F De Geuser, B. Gault, A. Bostel, F. Vurpillot, Surface Science 601, pp 536–543 (2007)
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Toward a Laser-assisted wide-angle tomographic atom-probe. B. Deconihout, F. Vurpillot, B. Gault, G. Da Costa, M. Bouet, A. Bostel, D. Blavette, A. Hideur, G. Martel, M. Brunel, Surface and Interface Analysis 39, pp 278-282 (2007)
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Design of a femtosecond laser assisted tomographic atom probe. B. Gault, F. Vurpillot, A. Vella, M. Gibert, A. Menand, D. Blavette, B. Deconihout, Review of Scientific Instruments 77, 043705 (2006)
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Investigation of an oxide layer by femtosecond-laser-assisted atom probe tomography. B. Gault, A. Menand, F. de Geuser, B. Deconihout, R. Danoix, Applied Physics Letters 88, 114101 (2006)
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Evidence of field evaporation assisted by non-linear optical rectification induced by ultrafast laser. A. Vella, F. Vurpillot, B.Gault, A. Menand, B. Deconihout, Physical Review B 73, 165416 (2006)
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Estimation of the cooling times for a metallic tip under laser illumination. F. Vurpillot, B. Gault, A. Vella, M. Bouet, and B. Deconihout, Applied Physics Letters 88, 094105 (2006)
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Design of a delay-line position-sensitive detector with improved performance. G. Da Costa, F. Vurpillot, A. Bostel, M. Bouet, B. Deconihout, Review of Scientific Instruments,76 013304 (2005)
Implementation of an Optical TAP: preliminary results. B. Deconihout, L. Renaud, G. Da Costa, M. Bouet, A. Bostel, D. Blavette, Ultramicroscopy, vol. 73, p. 253 (1998)