Cutting-edge Instruments for Research

Our scientific instruments measure and image the elemental and isotopic composition at the surface of solid objects. Micro- or nano-volumes of material are analyzed with extreme sensitivity (reaching ppb levels). Measurements are also very localized, ranging from a few cubic micrometers down to a single atom, depending on the instrument and the analysis technique.

Our SIMS product line includes: 

• IMS 7f: universal magnetic sector SIMS for materials and semiconductors
• IMS 7f-Auto: latest version of the IMS 7f for high throughput, fully automated microanalysis
• SC Ultra: magnetic sector SIMS for advanced semiconductors. 
• IMS 7f-GEO: magnetic sector SIMS for geoscience laboratories
• IMS 1280-HR: ultra high sensitivity magnetic Sector SIMS for geosciences
• NanoSIMS 50L: SIMS microprobe for ultra fine feature analysis in materials, geology, planetary and life sciences
• SIMS 4550: universal quadrupole SIMS for semiconductors and materials.  
• IMS 7fR: shielded magnetic sector SIMS for radioactive samples (on request)

Our EPMA product line includes: 

• SXFive: universal EPMA for geology and materials
• SXFiveFE: Field Emission EPMA for geology and materials
• Shielded SX: shielded EPMA for radioactive samples

Our 3D AP product line includes:

• LEAP Si: 3D laser atom probe offering highest acquisition rate for microelectronics applications 
• LEAP HR: 3D laser atom probe offering high mass resolution (also in voltage pulse mode) for advanced metal applications