CAMECA Logo
Worldwide contacts - Service & Support
Search


Home
AMETEK Materials Analysis Division
CAMECA Web Site
WORLD LEADER IN ELEMENTAL & ISOTOPIC MICROANALYSIS
spacer-10pix-high  
Scientific Instruments
for Research

The CAMECA instruments provide elemental and isotopic composition data from micron down to sub-nanometer scale and equip the most prestigious government and university labs as well as leading high tech industrial companies around the world.
Analytical techniques include SIMSEPMA and 3D Atom Probe, applications are most diverse: Earth & Planetary Sciences, Materials, Semiconductors, Life Sciences...

Research 
Metrology Tools
for Semiconductor

CAMECA develops in-fab and near-fab metrology equipment based on the LEXES and SIMS analytical techniques.
Our tools have been adopted by top semiconductor manufacturers worldwide and address major thin film and new material process control issues including: elemental composition and thickness in substrates, thin or thick multilayers, ULE implants, dopant dosimetry...

Semiconductor Metrology 
Recent news,
Upcoming events...


CAMECA invites to Workshop on Nano Probe Techniques at IIT Delhi. More>>

A third CAMECA SIMS at JAMSTEC. More>> 

Pennsylvania State University selects SXFive EPMA. More>>

Recent Nature Geoscience article reports on 4.4 billion year old zircon dating by Atom Probe Tomography. More>>

Come and meet us at:
M&M, Hartford, USA, 3-7 Aug
ISME, Seoul, Korea, 24-29 Aug
IMA, Gauteng, South Africa, 1-5 Sep
JASIS, Chiba city, Japan, 3-5 Sep
SIMS Europe, Münster, Germany, 7-9 Sep
Show full schedule>> 
instruments for research - metrology tools - applications - user publications - news - conferences - company - locations
Atom Probe Tomography (APT) - SIMS - EPMA - LEXES
© 2010-2012 AMETEK, Inc - CAMECA SAS. All Rights Reserved - www.ametek.com - www.atomprobe.com
privacy - trademarks - sitemap
Arabic - ChineseJapanese - KoreanPortugueseRussianSpanish