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About CAMECA
Microanalysis ?
Metrology Tools for semiconductors
Scientific Instruments for Research
Instruments for Earth, Planetary
& Solar Sciences.
Instruments for Research for Semiconductors
Instruments for Materials & Nuclear Sciences
Instruments for Life Sciences
Analysis
Techniques
EPMA (Electron Probe Micro-Analyzer)
Application:
mineralogy
Application:
physical metallurgy
Application:
glass
Comparison: SEM/EDS
SIMS (Secondary Ion Mass Spectrometry)
Static SIMS
Dynamic SIMS
LEXES (Low Energy X-ray Emission
Spectrometry)
LA-WATAP (Tomographic Atom Probe)
TXRF (Total X-Ray Fluorescence)
News
Publications: pdf and references
Application notes: pdf and references
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Contacts: Adresses and contacts of factory,
subsidiaries & agents
Guide to reaching Cameca
Map
of neighbourhood (184kB), general roadmap (330kB)
French wine guide...
SX100: Universal
EPMA
Instrument synopsis (64kB)
SX100R: Shielded EPMA
for radioactive samples
SX software upgrades
Shallow
Probe: LEXES for ULE implants & Ultra thin films
IMS 7f/ 7f-GEO: Universal
magnetic sector SIMS
Application and results obtained with a IMS 7f.
IMS 7fR: Shielded sector
SIMS for radioactive samples
Upgrade kits for IMS 4f-5f-6f-7f-1270-1280
IMS Wf - SC Ultra: SIMS for Ultra Low Energy &
full wafers Ultra shallow depth profiling
Deep depth profiling
High reproducibility and full wafer mapping
Eucentric rotating stage compatible with full wafer
New immersion lens for ULE-magnetic sector SIMS
Real-time In-situ depth scale measurement
NanoSIMS 50/ 50L: high resolution SIMS microprobe
Application:
Yttrium-Aluminum garnet
Application:
Study on mouse cochlea IMS 1280: large radius magnetic
sector SIMS for geology
SIMS 4550: Quadrupole SIMS with ULE capabilities
SIMS 4600: Full-wafer Quad-SIMS with ULE capabilities
LA-WATAP: Tomographic Atom Probe
TXRF 8300W: Full-wafer Total X-ray Fluorescence for Fabs.
Links to other websites
Events: conferences and exhibitions
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