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TAP & LASER-Assisted Atom Probe

(1.4MB)  LA-WATAP & SIMS as complementary techniques for quantitative measurement of nanometer structures. I. Martin, L. Renaud, A. Merkulov, P. Peres, M. Gilbert, E. Cadel, B. Deconihout. Presentation for SIMS XVI, Kanazawa, Japan, Nov 2007

(453kB) Snowplow effect and reactive diffusion in the Pt doped Ni-Si system.
O. Cojocaru-Mirédin, D. Mangelinck, K. Hoummada, E. Cadel, D. Blavette, B. Deconihout, C. Perrin-Pelligrino, Scripta Mater. (2007), doi:10.1016/j.scriptamat.2007.05.007

Fist stage of the formation of Ni silicide by atom probe tomography.  K. Hoummada, E. Cadel, D. Mangelinck, C. Perrin-Pellegrino, D. Blavette, B. Deconihout, Applied Physics Letter 89, 181905 (2006).

Investigation of an oxide layer by femtosecond-laser-assisted atom probe tomography,  B. Gault, A. Menand, F. de Geuser,  B. Deconihout, R. Danoix, Applied Physics Letters 88, 114101, 2006.

Structural investigation of TbCo2/Fe magnetostrictive thin films by Tomographic Atom Probe and Mössbauer spectrometry. A. Grenier, R. Lardé, E. Cadel, J.M. Le Breton, J. Juraszek, F. Vurpillot, N. Tiercelin, P. Pernod, J. Teillet,  Journal of Magnetism and Magnetic Materials 310 (2007) 2215–2216.

Design of a femtosecond laser assisted tomographic atom probe.  B. Gault, F. Vurpillot, A. Vella, M. Gibert, A. Menand, D. Blavette, B. Deconihout, Review of Scientific Instruments 77, 043705 (2006)

Evidence of field evaporation assisted by non-linear optical rectification induced by ultrafast laser,  A. Vella, F. Vurpillot, B.Gault, A. Menand, B. Deconihout, Physical Review B 73, 165416 (2006).

Estimation of the cooling times for a metallic tip under laser illumination,  F. Vurpillot, B. Gault, A. Vella, M. Bouet, and B. Deconihout, Applied Physics Letters 88, 094105, 2006.

Toward a Laser-assisted wide-angle tomographic atom-probe.  B. Deconihout, F. Vurpillot, B. Gault, G. Da Costa, M. Bouet, A. Bostel, D. Blavette, A. Hideur, G. Martel, M. Brunel, , Surface and Interface Analysis 2007; 39: 278-282

Comparative study of the beta''-phase in a 6xxx Al alloy by 3DAP and HRTEM.
H.K. Hasting, W. Lefebvre, C. Marioara, J.C. Walmsley, S. Andersen, R. Holmesstad, F. Danoix,
Surface and Interface Analysis, 2007; 39: 189-194

Correlated field evaporation as seen by atom probe tomography.
F De Geuser, B. Gault, A. Bostel, F. Vurpillot. Surface Science 601 (2007) 536–543.

Design of a delay-line position-sensitive detector with improved performance. G. Da Costa, F. Vurpillot, A. Bostel, M. Bouet, B. Deconihout, Review of Scientific Instruments,76  013304 (2005).

Three-dimensional atomic-scale imaging of impurity segregation to line defects.  D. Blavette, E. Cadel, A. Fraczkiewicz, A.Menand, Science, 17 dec 1999, volume 286, p. 2317-2319.

An atom probe for three-dimentional tomography,
D. Blavette, A. Bostel, J.M. Sarrau, B. Deconihout, A. Menand, Nature, vol. 363, p. 432 1993

Atomic scale investigation of boron nanosegregation in Fe Al intermetallics,   E. Cadel, D. Lemarchand, A.-S. Gay, A. Fraczkiewicz, D. Blavette, Scripta Materialia, vol. 41, n°4, p. 421 1999

Implementation of an Optical TAP: preliminary results,   B. Deconihout, L. Renaud, G. Da Costa, M. Bouet, A. Bostel, D. Blavette, Ultramicroscopy, vol. 73, p. 253 1998

Precipitation in 9Ni-12Cr-2Cu maraging steels,
K. Stiller, M. Hättestrand and F. Danoix, Acta Mater. Vol. 46, n° 17, p. 6063 1998

Precipitation of copper in iron under swift ion irradiations,
A. Barbu, P. Pareige, V. Jacquet, Nucl. Instr. and Meth. B, vol. 146, p. 278 1998 

Three-dimentional imaging of chemical order with the tomographic atom probe,
D. Blavette, B. Deconihout, S. Chambreland, A. Bostel , Ultramicroscopy, vol. 70, p. 115 1998 

Investigation of some selected metallurgical problems with the tomographic atom probe,
B. Deconihout, A. Bostel, P. Bas, S. Chambreland, L. Letellier, F. Danoix, D. Blavette, Appl. Surf. Sci., vol. 76/77, p. 145-154 1994

SIMS

(593kB)  Towards accuracy in SIMS depth profiling using ultra low energy PI ions, mathematical models and capping. H.-Ulrich Ehrke, Hans Maul, Norbert Loibl, Adam Sears, Paula Peres, Alex Merkulov, Michel Schuhmacher. Presentation for SIMS XVI, Kanazawa, Japan, Nov 2007

(140kB)  Challenges in localized high precision isotope analysis by SIMS
G. Slodzian. Slides of the invited talk for SIMS XIV, San Diego, USA, Sept 2003

(99kB)  QSA influences on isotopic ratio measurements. G.Slodzian, F. Hillion, F. J. Stadermann, E. Zinner. Poster for SIMS XIV, San Diego, USA, Sept 2003. Applied Surface Science 231–232 (2004) 874–877 

Precise in situ measurements of isotopic abundances with pulse counting of sputtered ions,
G. Slodzian, M. Chaintreau, R. Dennebouy, A. Rousse, Eur. Phys. J. AP 14, 199-231 (2001)

Localization of chemical element and isotopes in the leaf of soybean (Glycine max) by secondary ion mass spectrometry microscopy: CRITICAL CHOICE OF SAMPLE PREPARATION. N.Grignon, S.Halpern, J.Jeusset, P.Fragu ,  Journal of Microscopy, Vol 186, Pt 1, April 1997, pp.51-66

SIMS localization of nitrogen in the leaf of soybean: basis of quantitative procedures by localized measurements of isotopic ratios.  N.Grignon, J.Jeusset, E.Lebeau, C.Moro, A.Gojon, P.Fragu , J. trace and microprobe techniques, 17(4), 447-490 (1999)
 
IMS  7f

Improved automation system for the CAMECA IMS 7f. P. Peres, A. Merkulov, E. de Chambost, M. Schuhmacher, Poster for SIMS XV, Manchester, UK, September 2005
 
IMS Wf/ SC ULTRA

(155kB)  Toward accurate in-depth profiling of As and P ultra-shallow implants by SIMS. 
A. Merkulov, E. de Chambost, M. Schuhmacher and P. Peres. Oral presentation at SIMS XIV, San Diego, USA, Sept. 2003. Applied Surface Science 231–232 (2004) 640–644

(194kB). Accurate on-line depth calibration with laser interferometer during SIMS profiling experiment on the CAMECA IMS Wf instrument. O. Merkulova, A. Merkulov, M. Schuhmacher, and E. de Chambost. Oral presentation at SIMS XIV, San Diego, USA, Sept 2003.
Applied Surface Science 231–232 (2004) 954–958

(130kB) Latest developments for the CAMECA ULE-SIMS instruments: IMS Wf and SC-Ultra. 
E. de Chambost,  A. Merkulov, P. Peres, B. Rasser, M. Schuhmacher. Poster for SIMS XIV, San Diego, USA, Sept 2003.  Applied Surface Science 231–232 (2004) 949–953

Accurate in-depth profiling of As and P shallow implants by SIMS.  A.Merkulov, M. Schuhmacher, P. Peres, E. De Chambost. Poster for USJ 2003 (Ultra Shallow Junction conf., Santa Cruz, CA April 2003)

Depth resolution optimization with programmable raster for Ultra Low energy SIMS profiles with magnetic sector SIMS instruments. M. Schuhmacher, A. Merkulov, Paula Peres, E. De Chambost, poster for ULSI 2003, Austin, TX, March 2003

(122kB). Depth scale calibration of sims depth profiles by means of an on-line crater depth measurement technique.   E. De Chambost, P.Monsallut, B. Rasser, M. Schuhmacher, proceedings of SIMS XIII, nov 2001, Nara, Japan

Ultra Low energy Cs bombardment on magnetic sector SIMS instrument,
E. de Chambost, B. Boyer, B. Rasser, M. Schumacher, Poster for SIMS XII, Brussels, sept.99

Quad-SIMS 4550 and 4600

Accurate and Direct SIMS quantification in the first few nm of Ultra Shallow implants with Capping. Hans-Ulrich Ehrke, Hans Maul, Adam Sears, Alex Merkulov, Paula Peres, Michel Schumacher.
Poster for Insight 2007, Napa, USA, May 2007.

  Automated dose and dopant level monitoring by SIMS.
Hans Maul,Norbert Loibl, Ulrich ehrke, Alex Merkulov, Paula Peres, Michel Schuhmacher,
Poster in IIT2006, Marseille, june 2006.

  SIMS analysis of implanted and RTP annealed wafers for sub-100nm technology.
U. EHrke, A. Sears, W.Lerch, S. Paul, G.Roters, D.F.Downey, E.A.Arevalo, 
Paper at USJ 2003 published in JVST-B 22(1) Jan-Feb 2004.

Quantification of Ge and B in SiGe using secondary ion mass spectrometry
H-U. Ehrke, H. Maul. paper published in Mater SCi in Semicond Proc 8 (2005) 111-114.

 (660kB) High resolution depth profiling of nm-thin layers of STO in high-k oxide material with SIMS. H-U. Ehrke, A. Sears . Poster in ALD 2004 conference, Finland.

   Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of  resitive Si_1-xGe_x alloy layers. M. Dowsett and al.
Applied surface science, 9299 (2002) 1-4.

IMS1280 & IMS1270

(84kB). Achieving high reproducibility isotope ratios with the Cameca IMS1270 in the multicollection mode. M. Schuhmacher, F. Fernandes, E. De Chambost. Oral presentation at SIMS XIV, San Diego, USA, Sept. 2003. Applied Surface Science 231–232 (2004) 878–882 

Publication list 
 

IMS 7f-GEO

CAMECA IMS 7f-GEO: Specialized SIMS Tool for Geosciences. P. Peres, E. de Chambost, M. Schuhmacher. Submitted to SIMS XVI Proceedings, Kanazawa (Japan), October 2007. 

Introduction to the CAMECA IMS 7f-GEO. P. Peres, P. Saliot, E. De Chambost, M. Schuhmacher. Poster for Goldschmidt 2007, Cologne, August 2007. 

NanoSIMS 50

Cosmochemistry:

(499 kB)  Nitrogen and carbon isotopic composition of the sun inferred from a high-temperature solar nebular condensate.   Anders Meibom, A.N. Krot, F. Robert, S. Mostefaoui, S.S. Russell, M.I. Petaev, M. Gounelle.  The Astrophysical Journal, 656: L33-L36, 2007 Feb. 10.

(227 kB)  Isotopic compositions of Cometary matter returned by Stardust.
Kevin D. McKeegan et al.  Science vol 314, 15dec 2006, p. 1724- 1728.

(295 kB) Interstellar Chemistry recorded in organic matter from primitive meteorites.  Henner Busemann, Andrea F. Young, ConelM.O'D. Alexander, Peter Hoppe, Sujoy Mukhopadhyay, Larry R. Nittler.  Science, Vol. 312, 5 May 2006, p. 727-730.

(245kB) Supernova olivine from cosmetary dust.  Scott Messenger, Lindsay.P. Keller, Dante S. Lauretta.  Science, Vol. 309, 29 July 2005, p.737-741.

(262kB) Timescales of shock processes in chondritic and martian meteorites.
P. Beck, Ph. Gillet, A. El Goresy and S. Mostefaoui. Nature, Vol. 435 , 23 June 2005.

(613kB)  60Fe: a heat source for planetary differentiation from a nearby supernovae explosion
Smail Mostefaoui, G.W. Lugmair and P. Hoppe. The Astrophysical Journal, 625:271-277, 2005 May 20.

Supernova graphite in the NanoSIMS: Carbon, oxygen and titanium isotopic compositions of a spherule and its TiC sub-components.   F.J.Stadermann, T.K.Croat, T.J.Bernatowicz, S.Amari, S.Messenger, R.M.Walker and E.Zinner. Geochimica and Cosmochimica Acta, Vol.69, No.1, 2005.

(269kB) Discovery of ancient silicate stardust in a meteorite.  Ann N. Nguyen and Ernst Zinner.
Science, Vol.303 , 5 March 2004, p.1496-1499.

(302kB) Carbon and Nitrogen Isotopic Anomalies in an Anhydrous Interplanetary Dust Particle. 
Christine Floss, Frank J.Stadermann, John Bradley, Zu Rong Dai, Sasa Bajt, Giles Graham.   Science, Vol 303, 27 February 2004, p.1355 -1358.

(131kB) Samples of stars beyond the solar system: silicates grains in Interplanetary dust.   
Scott Messenger, Lindsay P. Keller, Frank J. Stadermann, Robert M. Walker, Ernst Zinner.  Science, Vol. 300, Issue 5616, 105-108, April 4, 2003.

(405 kB)  A NanoSIMS study of Si- and Ca-Ti-isotopic compositions of presolar silicon carbide grains from supernovae. Astrid Besmehn and Peter Hoppe.  Geochemica et Cosmochemica Acta, Vol. 67, No 24, pp. 4693-4703, 2003.

Publication page from the web site of the Max-Planck-Institut für Chemie, NAMIP group, Mainz, Germany.

Publication page of the web site of the Laboratory for the Space Science, Washington University in Saint Louis, MO, USA.

Geology, Environment:

(340kB) Extracellular proteins limit the dispersal of biogenic nanoparticles.
John W. Moreau, P. K. Weber, M.C.Martin, B.Gilbert, I.D.Hutcheon, J.F.Banfield.
Science, Vol. 316, 15 june 2007, p.1600-1604.

(268kB) Biological forcing controls the chemistry of reef-buiding coral skeleton.
Anders Meibom, S. Mostefaoui, J-P. Cuif, Y. Dauphin, F. Houlbreque, R. Dunbar, B. Constantz,
Geophysical Research letter, vol 34, L02601, 2007.

(4MB) Electron and ion microprobe analysis of calcium distribution and transport in coral tissues.
Alan T. Marshall, Peta L. Clode, Robert Russell, Kathryn Prince, Richard Stern.
The Journal of Experimental Biology 210, 2453-2463, 2007.

(857KB) Microdistribution of Mg/Ca, Sr/Ca, and Ba/Ca ratios in Pulleniatina obliquiloculata test by using a NanoSIMS: Implication for the vital effect mechanism. Daisuke Kunioka, Kotaro Shirai, Naoto Takahata, Yuji Sano, Takashi Toyofuku, Yurika Ujiie. G3, Volume 7, Number 12, 14 December 2006.

(218 kB) Elemental distribution in cephalopod statoliths: NanoSIMS provides new insights into nano-scale structure. Karsten Zumholz, Thor Hansteen, F. Hillion, F. Horreard, U. Piatkowski, Rev. Fish Biol Fisheries, accepted 30nov 2006.

(1.8 MB) Ion microprobe U-Pb dating of monazite with about five micrometer spatial resolution.
Yuji Sano,Naoto Takahata, Yukiyasu Tsutsumi and Tomoharu Miyamoto. Geochemical Journal, Vol. 40, pp. 597 to 608, 2006.

(216KB). Distribution of magnesium in coral skeleton.  Anders Meibom, J-P Cuif, F. Hillion, B. R. Constanz, A. Juillet-Leclerc, Y.Dauphin, T. Wanatabe, R.B. Dunbar. 
Geophysical Research Letter, vol. 13, L23306, 2004.

(275 kB). Colloid transport of Plutonium in the far-field of the Mayak production association, Russia.
Alexander P. Novikov, Stepan N. Kalmykov, Satoshi Utsunomiya, Rodney C. Ewing, François Horréard, Alex Merkulov, Sue B. Clark, Vladimir V. Tkachev, Boris F. Myasoedov.
Science, Vol 314, 27 october 2006, p. 638-641.

(6.5MB) Chemical Mapping of Proterozoic Organic Matter at Submicron Spatial Resolution.
Dorothy Z. Oehler, Francois Robert, Smail Mostefaoui, Anders Meibom, Madeleine Selo, and David S. McKay. ASTROBIOLOGY Volume 6, Number 6, 2006.

(275KB) Nano-SIMS Analysis of Mg, Sr, Ba and U in natural calcium carbonate. Yuji Sano, K. Shirai, N. takahata, T. Hirata, N.C.Sturchio.  Analytical Sciences, september 2005, vol.21, p1091-1097

(905 kB) Ion Microprobe (NanoSIMS 50) Pb-isotope geochronology at < 5µm scale. Richard A. Stern, Ian Fletcher, Birger Rasmussen, Neal J. McNaughton, Brendan Griffin
International Journal of Mass Spectrometry, May 25, 2005.

(232 kB).  NanoSIMS images of precambrian fossil cells. F. Robert, M. Selo, F. Hillion, A. Skrzypczak. Lunar and Planetary Sciences, League city, TX, March 2005.

(184 kB).  Study of the mechanism of diatom cell division by means of 29Si isotope tracing.
J-N. Audinot, C. Guignard, H-N. Migeon, L. Hoffmann.  SIMS XV proceedings, 2005.

Materials:

(1.46MB) High-resolution imaging of complex crack chemistry in reactor steels by NanoSIMS.
Journal of Nuclear Materials, Available online 19 August 2007, 
S. Lozano-Perez, M.R. Kilburn, T. Yamada, T. Terachi, C.A. English and C.R.M. Grovenor

(383 kB) NanoSIMS analysis of trace element segregation during the Al-Si eutectic reaction.
Christian J. Simensen, Oyvind Nielsen, Francois Hillion, Jorunn Voje, Metallurgical and Materials Transactions A, 2007 , DOI: 10.1007/s11661-007-9165-y.

(3.8MB). High-Temperature oxidation of a Cu-Ni based Cermet: kinetic and microstructural study.
F. Rioult, M. Pijolat, F. Valdivieso, M.A. Prin-Lamaze, Journal of American Ceramic society, 89 [3] 996-1005 (2006).

(299 kB)  Simultaneous multidopant investigation of rare-earth-doped optical fibers by an ion microprobe. F. Sidiroglou, S.T. Huntington, A. Roberts, R. Stern, I.R.Fletcher, G.W. Baxter.  Optics Letters, vol31, N°22, november 15, 2006.

(1 MB)  Three-dimensional investigation of microstructure of  multiphase steels.
Nathalie Valle, J. Drillet, O. Bouaziz, H-N. Migeon,  poster for SIMS Europe 2006.

(520 kB)  Multitechnique characterization of thin films of immiscible polymer systems: PS-b-PMMA diblock copolymers and PS-PMMA symmetric blends.  L. Kailas, B. Nysten, J-N. Audinot, H-N. Migeon, P. Bertrand.   Surface and Interface Analysis  2005; 37: 435-443.

(802 kB). Bainite characterization: carbon concentration measurements using the NanoSIMS 50.
Nathalie Valle, J. Drillet, O. Bouaziz, H-N. Migeon,   poster for SIMS Europe 2004.

(1.2 MB) Imaging Tof-SIMS and NanoSIMS studies of berite-celestite particles in grounds from paintings by van Gogh.  Beatrice Marino, Jaap J. Boon, Ella Hendriks, Francois Horreard, Francois Hillion.  Proceedings of 2006 AIC annual conference (American Institute for Conservation of Historic & Artistic Works).

Diamond film nucleation and interface characterization,
P. Bou, L. Vandenbulcke, R. Herbin, F. Hillion, J. Mater. Res., vol 7, N°8, Aug 1992.

Microbiology/ Cell Biology:

(1.4Mb) Single Cell Environmental Microbiology with Secondary Ion Mass Spectrometry at Sub-Cellular Resolution. F. Horreard, M. Kuypers , N. Musat, F. Hillion
Poster for American society of Microbiology, Boston, june 2008.

(4445kB) Linking Microbial Phylogeny to Metabolic Activity at the Single-Cell Level by Using Enhanced Element Labeling-Catalyzed Reporter Deposition Fluorescence In Situ Hybridization and Nanometer-Scale Secondary-Ion Mass Spectrometry. Sebastian Behrens,Tina Losekann, Jennifer Pett-Ridge, Peter K. Weber, Wing-On Ng, Bradley S. Stevenson, Ian D. Hutcheon, David A. Relman and Alfred M. Spormann. Applied and Environmental Microbiology, May 2008

(842 kB) Simultaneous analysis of microbial identity and function using NanoSIMS.
Tianlun Li, Ting-Di Wu, Laurent Mazéas, Laurent Toffin, Jean-Luc Guerquin-Kern, G. Leblon, Th. Bouchez. Environmental Microbiology (2007). On-line nov. 2007

Quantitative Imaging of Nitrogen Fixation by Individual Bacteria Within Animal Cells.
Claude Lechene, Yvette Luyten, Gregory McMahon, Daniel L. Distel. Science, 14 sept 2007, vol 317.

(268kB) Carbon and nitrogen fixation and metabolite exchange in and between individual cells of Anabaena oscillarioides.
Radu Popa, Peter K Weber, Jennifer Pett-Ridge, Juliette A Finzi, Stewart J Fallon, Ian D Hutcheon, Kenneth H Nealson and Douglas G Capone. The ISME Journal (2007) 1, 354–360.

High-resolution quantitative imaging of mammalian and bacterial cells using stable isotope mass spectrometry.  (4.9MB). Claude Lechene et al. , Journal of Biology 2006, 5:20. 30 pages.

(1.1MB).  Phase separation of Lipid membranes analyzed with high-resolution Secondary Ion Mass Spectrometry.  Mary L. Kraft et al., Science, 29 sept 2006, vol.313.

(439kB)  Sub-cellular localisation of a 15N-labelled peptide vector using NanoSIMS imaging.
 Winfried Romer , Ting-Di Wu , Patricia Duchambon , Mohamed Amessou , Daniele Carrez , Ludger Johannes , Jean-Luc Guerquin-Kern.

(2.5MB) Morphological and Chemical Studies of Pathological Human and Mice Brain at the Subcellular Level: Correlation BetweenLight, Electron, and NanoSIMS Microscopies.
Carmen Quintana, Ting-Di Wu, Benoit Delatour, Marc Dhenain, Jean Luc Guerquin-Kern, Alain Croisy.
Microscopy Research and Technique 70:281–295 (2007)

(3.38MB)  In-situ imaging mass spectrometry analysis of melanin granules in the human hair shaft. Hallegot, P. Peteranderl, R. Lechene, C.,   J Invest Dermatol 2004, 122, (2), 381-6

(330 kB) Direct NanoSIMS imaging of diffusible elements in surfaced block of cryo-processes biological samples.  P. Hallegot, J-N. Audinot, H-N. Migeon,   Proceedings of SIMS XV, 2005.

(631kB).  Ultra-structural cell distribution of the melanoma marker iodobenzamide: improved potentiality of SIMS imaging in life sciences.    BioMedical Engineering OnLine 2004, 3:10   Jean-Luc Guerquin-Kern, François Hillion, Jean-Claude Madelmont, Pierre Labarre, Janine Papon and Alain Croisy.

(728 kB) Subcellular imaging of isotopically labeled Carbon compounds in a biological sample by ion microprobe (NanoSIMS). Peta L. Clode, Richard A. Stern, Alan T. Marshall. Microscopy Research and Technique, 70: 220-229 (2007).
 
(396 kB). Supported Membrane composition analysis by SIMS with high lateral resolution.  Carine Galli Marxer, Mary L. Kraft, Peter K. Weber, Ian Hutcheon, Steven G. Boxer. Biophysical Journal, volume 88, April 2005  p. 2695-2975

(1.5MB). Study of the localization of iron, ferritin and hemosiderin in Alzheimer's disease hippocampus by analytical microscopy at the subcellular level. C. Quintana, S. Bellefqih, J.Y. Laval, J.L. Guerquin-Kern, T.D. Wu, J. Avila, I.Ferrer, R. Arranz, C. Patino. Journal of Structural Biology 153, 2006.

(1992kB). NanoSIMS - An Analytical Tool for Trace Metal Detection in Bone and Liver from Haemodialysis patients.  Poster for ASBMR 2004, Seattle.  John Denton, Francois Hillion, Francois Horreard and Alan G. Cox.

(250kB) Measurement of Carbon and Nitrogen Stable Isotope Ratios in Cultured Cells. Peteranderl, R. and C. Lechene. Journal of the American Society for Mass Spectrometry. 15: 478–485, 2004.

(1.67MB) Transport of 13C-oleate in adipocytes measured using multi imaging mass spectrometry.
Alan M. Kleinfeld, J. Patrick Kampf, and Claude Lechene.  Journal of the American Society for Mass Spectrometry.

(791 KB). Progress in analytical imaging of the cell by secondary ion mass spectrometry (SIMS microscopy). Jean-Luc Guerquin-Kern, Ting-Di Wu, Carmen Quintana and Alain Croisy.  Biochimica et Biophysica Acta 1724 (2005) 228 – 238.

We can recommend a book in which Dr. Nicole Grignon details in one chapter her long experience on bulk biological sample preparation for SIMS analysis (plants): Electron Microscopy Methods and Protocols, 2nd edition. Edited by John Kuo. Series: Methods in Molecular Biology. Humana Press.

Publication page from the web site of the NRIMS, National Resource for Imaging Mass Spectrometry, Harvard Medical Schhol/MIT/Brigham & Women's Hospital, Cambridge, MA, USA.

Physiological application of the NanoSIMS 50 ion microscope: localization at subcellular level of 15N labelling in Arabidopsis thaliana.N. Grignon, J. J. Vidmar, F. Hillion, B. Jaillard, Poster for SIMS XII, Brussels, sept. 99.

Subcellular localization of isotopes and labelled molecules by SIMS.
E. Hindié, Proceedings of SIMS XI, p.113, Orlando 1997.

Improvements in biomedical imaging by SIMS (IMS3f, 4f and NanoSIMS).
E. Larras-Regard and M-C. Mony, Proceedings of SIMS XI, p. 119, Orlando 1997.

NanoSIMS 50 & 50L Instrumentation:

(1 MB). Development and characterization of the new NanoSIMS 50L, F.Hillion, F.Horreard, M. Schuhmacher. Poster for SIMS XVI, Kanazawa, japan, Oct.2007

(39kB). Oxygen Isotopic Measurements on the CAMECA NanoSIMS 50, G.Slodzian, F.Hillion, F.J.Stadermann, F.Horreard, proceedings of SIMS XIII, nov 2001, Nara, Japan

(551kB).  Recent results and developments on the CAMECA NanoSIMS 50, Poster for SIMS XII, Brussels, sept. 99 F. Hillion, F. Horreard, F. J. Stadermann.

(232kB) Ultra fine feature analysis using secondary ion emission (basis for the NanoSIMS 50),
M. Schuhmacher, F. Hillion, ISAM 95.

The CAMECA NanoSIMS 50. Experimental results,
F. Hillion, B. Daigne, F. Girard, G. Slodzian, Proceedings of SIMS X, p.979, Münster 1995.

A new high performance instrument: the CAMECA NanoSIMS 50,
F. Hillion, B. Daigne, F. Girard, G. Slodzian, Proceedings of SIMS IX, p.254, Yokohama 1993.

Ion optics for a high resolution scanning ion microscope and spectrometer : transmission evaluations,
G. Slodzian, B. Daigne, F. Girard, F. Hillion, Proceedings of SIMS IX, p.294, Yokohama 1993.

LEXES

(439kB) The low Energy X-ray Spectrometry technique as Applied to Semiconductors.
Pierre-Francois Staub, Microscopy and Microanalysis, 12, 1-7, 2006.

(78kB). Dopant Dose Metrology for Ultra-Shallow Implanted Wafers Using Electron-Induced X-ray Spectrometry at Pattern-Size Scale. P.-F. Staub, R. Benbalagh, F. Desse, C. Hombourger, M. Schuhmacher. Proceeding of the 2005 International Conference on Characterization and Metrology for ULSI Technology, University of Texas at Dallas, March 15-18, 2005. 

(202kB). In-Line Quantitative Dose Metrology of Ultra Thin Gate Oxides. Y.Jee et al (Samsung). Proceedings of the 2005 International Conference on Characterization and Metrology for ULSI Technology, University of Texas at Dallas, March 15-18, 2005.

Precise and Localized Dose Control on Ultra-Shallow Implanted Wafers using Electron-Induced X-Ray Measurements. P.-F.Staub. Recent Advances in Ultra Shallow Junctions,  ITC-irst, Povo -Trento, Italy Nov. 24-25, 2004. Slides of the talk.

The LEXES Technique as applied to Semiconductors. P.F.Staub, EMAS 2005, Firenze, Italy, May 22-25, 2005. Slides of the talk.

Thin and Surface Structures Metrology with Low Energy X-Ray Emission Spectrometry: Principle and Advantages. P.-F.Staub, 11th Topical Conference on Quantitative Surface Analysis, Boston Peabody,  USA. Oct.28th-29th 2005. Slides of the talk.

High Accuracy and Rapid Dose Measurements for Ultra-Low Energy Ion Implantation using Low Energy X-ray Emission Spectroscopy. ITT2002, Taos, NM, USA.  Sean F. Corcoran (Intel Corp.), Chrystel Hombourger, Pierre Staub, Michel Schuhmacher (Cameca)

Characterization of Indium Doping Profiles using LEXES and SIMS.
Dimitry Kouzminov, Yupu Li,  Jerry Hunter (Accurel Systems Int.), Houda Graoui, Amir Al-Bayati, Majeed Foad (Applied Materials), Pierre Staub, Chrystel Hombourger, Michel Schuhmacher (Cameca). ITT2002, Taos, NM, USA.

Quantitative Analysis of Sub-Surface Implanted Species in Si wafers using the LEXES Technique.
P.-F. Staub, C. Hombourger, M. Schuhmacher ,  Poster for ECASIA 01, Avignon, France, Sept 30 - Oct 5, 2001

Quantitative characterization of thin structures by LEXES technique.  A.Davis, D. Snoeyenbos, C. Hombourger, P.F. Staub, M. Schuhmacher, F. Desse , Poster for QSA9, oct 2001

(312 kB) .Quantitative determination of dopant dose in ultra-shallow implants using the LEXES technique  P.F. Staub, C. Hombourger, M. Schuhmacher,  J. Vac. Sci. Technol. B, January 2001

(72 kB) .  LEXES and SIMS as complementary techniques for full quantitative characterization of nanometer structures   C. Hombourger, P.F. Staub, M. Schuhmacher, F. Desse, E. de Chambost, C. Hitzman, proceedings of SIMS XIII, nov 2001, Nara, Japan.
 
EPMA

(371kB) Constructing ternary phase diagrams directly from EPMA compositional maps. D. R. Snoeyenbos, D. A. Wark, J.-C. Zhao. Abstract of the oral presentation at M&M, Albuquerque, USA., August 2008

(356kB) A New Generation of Column for the Cameca Electron Microprobe SX100 
C. Fournier, D. Snoeyenbos, slides of the oral presentation for M&M 2003 conference, San Antonio, TX USA, August 3-7, 2003

(63kB)  A new Generation of EPMA Software : Simulation Assisted Microprobe Automation
C. Fournier, C. Merlet, P.F. Staub , Poster for EMAS 2001, Tampere, Finland, May 6-10, 2001

(116kB)  X Ray Spectra simulation for WDS : Application to Electron Microprobe automation
C. FOURNIER, P. F. STAUB, C. MERLET, O. DUGNE , Slides of the oral presentation for M&M 2001 conference, Long Beach, CA USA, August 5-9, 2001

(514kB)  An expert system for EPMA
Cecile Fournier, Claude Merlet, Pierre F. Staub, Olivier Dugne. Mikrochim. Acta 132, 531-539 (2000)

Imaging of cathodoluminescence zoning in calcite by scanning electron microscopy and hyper-spectral mapping, M. Lee, R.W. Martin, C. Trager-Cowan and P.R. Edwards, Journal of Sedimentary Research 75 313-322 (2005)

Tracking and quantifying trace elements in the ppm to tens of ppm range:

Determination of Nb, Ta, Zr and Hf in micro-phases at low concentrations by EPMA, F. Kalfoun, C. Merlet, and D. Ionov, Mikrochimica Acta, 139, (2002) p.83–91.
Advances in Electron Microprobe Trace-Element Analysis, B. W. Robinson and J. Graham, Journal of Computer-Assisted Microscopy, vol. 43, (1992) p. 263–265.
Electron microprobe determination of minor and trace transition elements in silicate minerals: a method and its application to mineral zoning in the peridotite nodule PHN 1611, C. Merlet and J. L. Bodinier, Chemical Geology, 83, (1990) p. 55–69.
(4.3Mb).  Assessment of the Primary Structure of Slabs and the Influence on Hot- and Cold-Rolled Strip Structure.  Hubert Presslinger, Michael Mayr, Ernst Tragl, Christian Bernhard. Steel Research Int. 77 (2006) N02.

Determining the contents of micrometer and sub-micrometer volumes:

The dependence of the optical energies on InGaN composition, K. P. O'Donnell, et al, Materials Science and Engineering: B82, (2001) p. 194–196.
Submicrometer phase chemical composition analysis with an electron probe microanalyser, F. C. Y. Wang, X-Ray Spectrometry, 23, (1994) p. 203–207.
Scanning electron microscopy techniques in the study of atmospheric aerosol particles, J. C. Seymour, R. N. Guillemette, and N. W. Tindale, Proc. 28th annual MAS meeting, Ed. J.J. Friel, New Orleans, LA, (1994) p. 65–66.

Geochronology using quantification of Monazite:

Electron probe (Ultrachron) microchronometry of metamorphic monazite: Unraveling the timing of polyphase thermotectonism in the easternmost Wyoming Craton (Black Hills, South Dakota). Dahl, P.S. et al.(2005), American Mineralogist, 90, 1712-1728.
Analytical perils (and progress) in electron microprobe trace element analysis applied to geochronology:  Background acquisition, interferences, and beam irradiation effects. M. J. Jercinovic and M. L. Williams,  American Mineralogist (2004)
Microprobe monazite geochronology: putting absolute time into microstructural analysis, M. L. Williams and M. J. Jercinovic, Journal of Structural Geology, 24, (2002) p. 1013-1028.
Electron microprobe dating of monazite,  J. M Montel, S. Foret, et al, Chemical Geology 131, (1996) p. 37–53.

Performing quantitative analysis with sub-nanometric depth resolution:

Capability and Uncertainty in Multilayer Quantitative Procedure with Electron Probe Microanalysis, C. Merlet, Proceed. of Microscopy and Microanalysis, Edited by E. Voelkl, D. Piston, R. Gauvin, A. J. Lockley, G. W. Bailey, and S. Mckernan, Microscopy and Microanalysis, Vol 8, supp.2, Cambridge University press, (2002) p. 428–429.
Study of surface modification of uranium and UFe2 by various surface analysis techniques, O. Bonino, O. Dugne, C. Merlet, E. Gat, Ph. Holliger, and M. Lahaye, Journal of Nuclear Materials 294, 3, (2001) p. 305.
EPMA sputter depth profiling: a new technique for quantitative in-depth analysis of layered structures, P. Karduck and A. von Richthofen, Proc. 29th annual MAS meeting, (1995) p. 205–206.

Ultralight element quantification in sub-micron volumes, coatings or micrometer phases:

Identification by EPMA of submicron borides in joints of nickel base superalloys, C. Pascal, C. Merlet, R. M. Marin-Ayral, J. C. Tédenac, and B. Boyer, Mikrochimica Acta vol. 145, Numbers 1-4, (2004) p. 147–151.
Electron probe microanalysis of submicron coatings of ultralight elements, P. Willich and R. Bethke, Microbeam Analysis, 2, (1993) p. 45–52.
Electron-probe microanalysis of ultra-light elements in multiphase diffusion couples, W. Lengauer, J. Bauer, M. Bohn, H. Wiesenberger, and P. Ettmayer, Proc. 4th EMAS European workshop, (1995) p. 374.

Fine chemical investigations using soft X-ray capabilities:

Electron probe microanalysis near phase boundaries of Cu-TiN system, C. Fournier, S. Lequeux, C. Fucili, F. Le Guyadec, and C. Merlet, proceedings 3rd Regional Workshop EMAS '98, Barcelona, Spain, p.343.
Spectral decomposition of wavelength dispersive X-ray spectra: implications for quantitative analysis in the electron probe microanalyser, G. Rémond, J. L. Campbell, R. H. Packwood, and M. Fialin, Scanning Microscopy Supplement, 7, (1993) p. 89–132.
EPMA studies of L-emission spectra and measurements on Mn La self-absorption coefficient as indicator of its chemical state in minerals, I. P. Laputina, V. A. Batyrev, V. V. Changulov, and I. B. Baranova, Proc. 4th EMAS European workshop, (1995) p. 370.

TXRF  

(433 ko).  Basic features of total reflexion x-ray fluorescence analysis on silicon wafers.
Wolfgang Berneike, Spectrochimica Acta, vol 48B, N° 2, pp. 269-275, 1993.

(423 ko).  Spin-On Wafer Contamination Evaluated with TXRF and SIMS. H-U. Ehrke, A. Sears, S. Greithanner, J. Van Hoeymissen and J. Rip. Poster presented at TXRF 2007 conference, 18-22 June 2007, Trento, Italy.