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- SX100
UNIVERSAL
EPMA
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First launched in 1994, the SX 100 is the latest generation CAMECA EPMA instrument. The central concept is a
fully digitized instrument with highly integrated electronics and full automation
for unattended analysis and evaluation. Comfort and ease of control are made
possible by the dedicated keyboard together with the ergonomic software interface.
The tradition
of superb analytical performances, based on the famous precision and reliability
of the CAMECA WDS analyzers and extreme stability of the primary beam, has
been continued. An uninterrupted development program has led to the introduction
of new features.
Major applications are found in: geochemistry, mineralogy, geochronology,
physical metallurgy, nuclear metallurgy, materials
science including glass, ceramics,
superconductors, cements, microelectronics, biochemistry, ...
Among the characteristic points or recent improvements and innovations:
- Choice of up to
5 WDS detectors plus one EDS detector, in parallel.
- Choice of vertical
or inclined detectors for polished or rough samples.
- Continuous zoom
on the optical microscope (from 250 µm to 1.7 mm field)
- Extensive new
PeakSight software under PC Microsoft Windows XP and 2000 environments, with specialized modules (true
quantitative mapping, geochronology, Expert system, Phase analysis, Point
logger, Image overlay, Particle search, Aphelion complete image processing,
etc..).
- Standard Tungsten
electron emitter.
- In
option, LaB6 electron source with new power supply and new electron column
optimized for EPMA (10keV/0.2-0.3µm).
- Choice
of turbomolecular or diffusion pumps.
- 0.1 µm
step size with the standard SX100 sample stage retaining high-speed travel.
- Ultra-fine beam
position stability (100 nm in the long term) with beam tracking.
- New video camera
for cathodoluminescence applications.
- New High Sensitivity
(large) crystals for faster analysis and better detection limits.
- Increased
dynamic range of BSE pre-amplifier for measurements at high beam current.
- Multicollection
acquisition mode with several spectrometers measuring same line for higher
sensitivity on trace elements.
A synopsis (315kB) of the
instrument can be downloaded.
