SX 100 and Shielded SX 100R: Electron Probe MicroAnalyzer (EPMA) for localized (< 1µm), precise elemental quantitation and mapping of solid materials, between 100wt% and a few ppm. Used in Metallurgy (coatings and multilayers, segregation, corrosion, contamination, precipitates, light elements..), Ceramics and Glasses (composition of bulk and inclusions,  diffusion, ...), Composite materials (interface, inclusions..), Catalysis. The Shielded SX 100R allows analysis of Radioactive samples.

IMS 7f and Shielded IMS 7fR: universal magnetic sector SIMS for Depth Profiling with ultra high sensitivity (down to ppb atomic concentration) and 2D or 3D imaging of trace elements. Used in Metallurgy (coatings and multilayers, segregation, corrosion, contamination, precipitates), Ceramics and Glasses (trace element, diffusion studies with tracer isotopes), Composite materials (interface, inclusions), Catalysis, Environmental studies. The IMS 7fR allows analysis of Radioactive samples. 

NanoSIMS 50: SIMS microprobe with multicollection for ultra fine feature analysis. Allows high resolution 2D mapping of trace elements and dopant in research and development environment (Ceramics, Composite materials, Metallic alloys, sub-micron  inclusions, aerosol and contamination particle isotopic & elemental characterisation...). Allows ppm elemental detection limits at 50nm resolution on unprepared or electrically insulating samples. 

SIMS 4550: universal high performance quadrupole SIMS microprobe for depth profiling with high sensitivity and 2D or 3D imaging of trace elements. The low extraction field ensures easy insulator analysis and the flexibility of the geometry permits optimized analytical conditions. The design and software automation ensure ease of use for multiple user and unattended operation. 

LA-WATAP: LASER-Assisted Atom Probe  allowing 3D chemical analysis of materials  with atomic spatial resolution. The analyzed volume can be as large as 100nm x 100nm x several hundreds nm. The unique femto-second LASER evaporation mode allows access to semiconductors and insulating samples, applications formerly excluded from conventional Atom Probe.