Materials Analysis in Nuclear Science

Nuclear-science-SIMS
Offering extreme sensitivity, high depth and lateral resolution together with high throughput, Dynamic SIMS (Secondary Ion Mass Spectrometry) proves extremely useful for a wide range of nuclear science applications:
• Characterization of plasma facing materials in fusion devices
• Control of thermal and irradiation effects on fission products
• Investigation of long-term behavior of nuclear materials for safe waste disposal
• Study of uranium accumulation processes in human tissues and cells.

The CAMECA IMS 7f-Auto magnetic sector SIMS is the tool of choice for these applications.

Download the application note:
SIMS for Materials Analysis in Nuclear Science