Atom Probe Tomography of Magnetic Thin Films

Tuesday, October 9, 2018

Magnetic thin films that have perpendicular magnetic anisotropy are now being used in data storage, magnetic random-access memory (MRAM), and spintronics applications. The new application note investigates one example of such a complex magnetic system, consisting in a multilayer of alternating layers of Co90Fe10 and Pd, describing how both transmission electron microscopy (TEM) and atom probe tomography (APT) characterization are used to provide a deeper understanding of the materials’ complex microstructure.

Download here:
- APT of Magnetic Thin Films for storage, memory & spintronics applications

Other recent Atom Probe Tomography application notes
- Nanocluster Analysis for Nuclear Structural Materials

- Correlative Grain Boundary Characterization in the Local Electrode Atom Probe