Worldwide contacts - Service & Support

AMETEK Materials Analysis Division
CAMECA Geoscience Applications
Path: Home>Applications>Geosciences>Overview
From Geochronology to Environmental Studies...

Click on any of the application examples listed below to learn more...


- Analysis of extra-cellular biomineralization with the NanoSIMS 50


- Zircon Dating with the IMS 1280-HR
- Monazite Dating with EPMA


- Rare Earth Element Analysis with the IMS 7f-GEO
- Quantitative analysis of pyroxene at high spatial resolution with FEG-EPMA
- Zoned Mineral Analysis with EPMA

Stable isotopes

- Analysis of carbon isotopes with the IMS 1280-HR
- Analysis of magnesium isotopes with the IMS 1280-HR

Environmental studies

- Nuclear Particle Analysis with the IMS 1280-HR

Our geoscience product line includes:

The SXFive (EPMA) for localized, precise elemental quantitation and mapping of mineral phases, between 100wt% and a few ppm. Widely used in mineralogy, petrography, geochronology (monazites) and cosmochemistry.

The SXFiveFE (FEG-EPMA) for high spatial resolution (sub-micron scale) x-ray mapping and quantitative analysis of minerals, trace and minor elements.

The IMS 7f-GEO: optimized for localized (0.5µm-50µm) quantitation and mapping of isotopes and trace elements (down to ppb concentration level), as well as for stable isotope measurements (H, B, C, O, S,..) and REE analysis.

The NanoSIMS: offering a seven-mass multicollection together with 50nm resolution, it is used for isotopic or elemental analysis and mapping of sub-micron features.

The IMS 1300-HR³ which provides the highest transmission (=sensitivity) at high mass resolution along with multicollection. It ensures precision & reproducibility at the level of tenth of permil, from small area measurements (5-50µm). The ultimate tool for the analysis of stable isotopes, trace elements (light and Rare Earth Elements) and for geochronology (U, Th, Pb).



instruments for research - metrology tools - applications - user publications - news - conferences - company - locations

Atom Probe Tomography (APT) - SIMS - EPMA - LEXES - ICP-MS - GD-MS - TIMS

© 2010-2016 AMETEK, Inc - CAMECA SAS. All Rights Reserved -
privacy - trademarks - sitemap